A multi-sample automatic sample changing device for x-ray polycrystal diffractometer

Abstract

The invention provides a multi-specimen automatic specimen change device for an X-ray polycrystalline diffraction instrument. The multi-specimen automatic specimen change device comprises specimen plates, a specimen conveying mechanism, a specimen replacing mechanism, a photoelectric sensor module, a photosensitive resistance sensor module, a control circuit module and a power source module, wherein the photoelectric sensor module is arranged at the specimen conveying mechanism and is used for detecting the specimen plate conveying; the photosensitive resistance sensor module is arranged at the diffraction instrument and is used for detecting the brightness of a diffraction instrument shutter lamp; when the specimen plates to be tested by the diffraction instrument are placed by using a conveying belt taking and using position as a starting point to form a specimen plate detecting queue; the specimen replacing mechanism is positioned between the taking and using position and a diffraction instrument specimen table; the specimen plates are inserted in the diffraction instrument specimen table; the specimen replacing mechanism comprises two clamping elements, an action driving element and a strip-shaped rotating table; when the strip-shaped rotating table rotates and the two ends of the strip-shaped rotating table are adjacent to the taking and using position and the diffraction instrument specimen table, the two clamping elements move to the two ends of the strip-shaped rotating table for performing operation on the specimen plates. The multi-specimen automatic specimen change device can realize automatic specimen replacement of the X-ray polycrystalline diffraction instrument at low cost.

Description

technical field [0001] The invention relates to the field of detection instruments, in particular to a multi-sample automatic sample changing device for an X-ray polycrystal diffractometer. Background technique [0002] X-ray polycrystal diffractometer is used to analyze the phase structure and phase composition of materials, etc. It is an important instrument in the research fields of materials, chemistry and geology. Conventional X-ray polycrystal diffractometers are usually only equipped with a fixed sample stage, and each time a sample is tested, the sample needs to be replaced manually, and the work efficiency is low. In recent years, with the widespread deployment of high-speed detectors, the test speed of diffractometers has been improved, and the test time for each sample has been shortened from tens of minutes to several minutes. This also requires frequent opening of the diffractometer door to replace samples during the test process, which may easily cause failure...

AI Technical Summary

Problems solved by technology

Due to the complex structure of the mechanical automatic sample changing device, the price is very expensive

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