Automatic sample changer for X-ray polycrystal diffractometer

Abstract

The invention relates to an automatic sample changer for an X-ray polycrystal diffractometer. The automatic sample changer comprises sample boards, a sample table, a magnet sheet, a Hall sensor module, a rotating shaft, a stepping motor, a motor drive module, a photoresistor sensor module, a singlechip and wires, wherein the sample boards are uniformly distributed on the sample table in a circumferential or fan-shaped mode, and the included angle between the adjacent sample boards and the connecting line of the circle center of the sample table is A; the sample table is connected with the stepping motor around the rotating shaft; the photoresistor sensor module is used for detecting a diffractometer shutter lamp; the photoresistor sensor module is connected with the singlechip; when the diffractometer shutter lamp is turned down, the singlechip controls the stepping motor to rotate the sample table by the angle in the preset direction; the magnet sheet is fixed to the edge of the sample table; the Hall sensor module is adjacent to the edge of the sample table; and when the sample table is rotated to the position where the Hall sensor is triggered by the magnet sheet, the singlechip is triggered to reset and stops rotating the sample table. The automatic sample changer can implement automatic sample changing of the X-ray polycrystal diffractometer at lower cost.

Description

technical field [0001] The invention relates to the field of detection instruments, in particular to an automatic sample changing device for an X-ray polycrystal diffractometer. Background technique [0002] X-ray polycrystal diffractometer is used to analyze the phase structure, phase composition and grain size of materials, and is widely used in the fields of materials, chemistry, geology and medicine. Conventional X-ray polycrystalline diffractometers are usually only equipped with a fixed sample stage. After each sample is tested, the sample needs to be replaced manually. The work efficiency is low, and the diffractometer door is frequently opened and closed, which reduces its service life. Although the X-ray polycrystalline diffractometer can also be equipped with a commercial rotary sample changer for multi-sample testing, this type of sample stage is expensive and requires additional hardware and software support for the diffractometer, and the versatility between dif...

AI Technical Summary

Problems solved by technology

However, during the X-ray polycrystalline diffraction test, the intensity of the diffracted X-rays is very weak, and it is very difficult to judge whether the test is completed through an additional X-ray detector

In addition, the diffraction light path is usually not allowed to be shielded, and it is not practical to add an additional X-ray detector to the light path

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