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System for measuring composite coordinate based on multi-aiming device

A technology of coordinate measuring system and aiming device, applied in the field of compound coordinate measuring system, can solve the problems of low precision and large detection error, etc.

Active Publication Date: 2017-01-25
BEIJING CHANGCHENG INST OF METROLOGY & MEASUREMENT AVIATION IND CORP OF CHINA
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  • Abstract
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  • Claims
  • Application Information

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Problems solved by technology

[0003] The purpose of the present invention is to solve the problem of large detection error and low precision of traditional coordinate measuring machines, and propose a composite coordinate measuring system with multiple aiming devices

Method used

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  • System for measuring composite coordinate based on multi-aiming device
  • System for measuring composite coordinate based on multi-aiming device

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Embodiment Construction

[0029] The technical solution of the present invention will be described in detail below in conjunction with the accompanying drawings.

[0030] Such as figure 1 and figure 2 As shown, a compound coordinate measuring system based on multiple aiming devices includes a three-coordinate measuring machine, a laser interferometer, an inductive micrometer, a photoelectric microscope, a mechanical motion system, an adjustable workbench, and an embedded control and data processing system.

[0031]The three-coordinate measuring machine includes the three-coordinate measuring machine probe system, the grating system and the three-coordinate machine control system. The function of the three-coordinate measuring machine probe system is to detect the position of the measured part and feed back the current state to the three-coordinate measurement control system. The function of the grating system is to serve as the length measurement datum of the three-coordinate measuring machine and p...

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Abstract

The invention relates to a system for measuring a composite coordinate based on a multi-aiming device and belongs to the field of measurement technology. The system provided in the invention comprises a coordinate measurer, a laser interferometer, an inductance micrometer, a photoelectric microscope, a mechanical kinematic system, an adjustable working table and an embedding control and data processing system. One-dimensional high-precision contacting coordinate measuring system composed of the embedding control system, mechanical kinematic system, laser interferometer, inductance micrometer and adjustable working table and conforming to the Abbe principle and one-dimensional non-contacting coordinate measuring system composed of the embedding control system, coordinate measuring machine, mechanical kinematic system, laser interferometer, photoelectric microscope and adjustable working table and conforming to Abbe principle can realize testing different testing pieces,such as realizing the needed measuring function of multiple length measurers of a club, a stepgage, a gauge block, a caliper gauge, a ring gauge, a screw, a linear scale, a dividing plate and the like. The machine has multi-purpose and wide social benefit and prospect.

Description

technical field [0001] The invention relates to a compound coordinate measuring system based on multiple aiming devices, belonging to the technical field of measurement. Background technique [0002] With the improvement of mechanical processing level and computer software technology, coordinate measuring machine has increasingly become the most widely used and most versatile measuring instrument in the field of length measurement. However, due to the detection error of its own probe, the mechanical gap and positioning error of the three-axis guide rail, the graduation error and Abbe error of the grating scale, the traditional coordinate measuring machine is difficult to improve its accuracy. Moreover, conventional coordinate measuring machines only have the function of contact measurement. Coordinate measuring machines with non-contact measurement function also measure by image scanning and recognition, and generally cannot accurately target the position of the end face. T...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01B21/00
CPCG01B21/00
Inventor 钱丰孙玉玖武文彬唐志锋何磊
Owner BEIJING CHANGCHENG INST OF METROLOGY & MEASUREMENT AVIATION IND CORP OF CHINA
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