Full-automatic crystalline silicon solar cell quality testing machine

Abstract

The invention discloses a full-automatic crystalline silicon solar cell quality testing machine. The full-automatic crystalline silicon solar cell quality testing machine includes a machine table, an electric control device, a driving mechanism, a detection table, an adhesive tape fixing device, an adhesive tape pressing wheel mechanism and a cutter; the top surface of the machine stage is provided with a mounting plate; an elongated through hole is formed in the mounting plate; the detection table passes through the elongated through hole; an elongated hole is formed in the top surface of the machine table; the driving mechanism is connected with the bottom surface of the detection table through the elongated hole so as to drive the detection table to move on the machine table; the adhesive tape fixing device, the cutter and the adhesive tape pressing wheel mechanism are all fixed on the mounting plate; the adhesive tape fixing device is mainly composed of a rotation shaft and a rotation wheel; the adhesive tape pressing wheel mechanism comprises a lifting pressing wheel; a gap is left between the pressing wheel and the detection table; the height of the gap is adjustable; and the cutter is located between the rotation wheel and the pressing wheel. With the full-automatic crystalline silicon solar cell quality testing machine of the invention adopted, automatic detection of the printing effect of silicon wafer grid lines to be detected can be realized; detection results are accurate; detection efficiency can be improved; time and effort can be saved; and the quality of silicon wafers can be ensured.

Description

technical field [0001] The invention relates to silicon solar cell technology, in particular to a fully automatic crystalline silicon solar cell quality testing machine, which is used to detect the printing effect of silicon chip grid lines during the production process of photovoltaic crystalline silicon cells. Background technique [0002] Grid lines on crystalline silicon solar cells are used to collect current and are one of its important components. The traditional method for testing the printing effect of the grid lines of crystalline silicon solar cells in this industry is: manually press and stick the 3M tape directly on the grid lines of the silicon wafer, and then peel off the tape to observe the slurry on the grid lines or the back field If it is stuck by the tape, it can be used to detect whether the grid line is printed firmly. If the paste on the gate line or the back field of the silicon wafer is stuck by the tape, it means that the printing effect of the gat...

AI Technical Summary

Problems solved by technology

[0004] (1) When manually sticking the tape on the silicon wafer by hand, it is inevitable that the hand will come into contact with the silicon wafer, which will cause contamination of the silicon wafer to be tested

[0005] ⑵ Manually stick the tape on the silicon wafer, because the tape is easy to stick unevenly, so the test result will be distorted

[0006] ⑶ Manually press the tape directly on the grid line of the silicon wafer by hand, and the excessive pressure will cause the silicon wafer to break or crack

[0007] ⑷This method of manual detection of silicon wafers is not only labor-intensive, but also low in detection efficiency, time-consuming and labor-intensive

Images