Sample for measuring high temperature fracture toughness and preparation method thereof

Abstract

The invention relates to a sample for measuring high temperature fracture toughness and a preparation method thereof. The sample comprises a sample body with a gap in the left end, the left end of the sample body is connected with an additional cutter point, a line cutting groove is formed in the additional cutter point, and the line cutting groove penetrates through the additional cutter point and is communicated with the gap. The upper side edge and the lower side edge of the line cutting groove are connected with locating baffles respectively, and a T-shaped structure is formed. The locating baffles are oppositely arranged, and cutter point locating grooves are formed in the middles of the locating baffles respectively. The compact tensile sample capable of being used for the metal material fracture toughness testing experiment under high-temperature conditions, the line cutting groove is formed, and therefore the sample and a high-temperature COD gauge can be clamped and matched conveniently. The cutter point locating grooves are formed, so that the situation that due to the fact that the high-temperature COD gauge slides and even slides out, the experiment is not precise or fails is avoided. Due to the fact that the additional cutter point and the sample are integrally machined, the assembly problem before the experiment is avoided, therefore, the sample can be clamped on a machine conveniently, meanwhile, the clamping precision of the sample is guaranteed, and finally the accuracy and effectiveness of the experiment of the sample are guaranteed.

Description

[0001] 【Technical field】 [0002] The invention relates to the field of material testing, in particular to a sample for measuring high-temperature fracture toughness and a preparation method thereof. [0003] 【Background technique】 [0004] At present, the samples for high temperature fracture toughness tests at home and abroad usually adopt the following two forms: [0005] (1) The sample without the positioning device specified by COD. This kind of sample is directly clamped without limit in the test. During the test, the COD gauge is likely to slip or even slip out, causing the test to be inaccurate or fail; [0006] (2) Samples with a COD-specified positioning device. Fix the positioning baffle on the sample with fastening screws. This kind of sample preparation requires processing two threaded holes on the sample and processing two positioning baffles. Fix the positioning baffle on the sample with fastening screws. On, and the fastening screw is easy to sinter at high ...

AI Technical Summary

Problems solved by technology

Fix the positioning baffle on the sample with fastening screws. This kind of sample preparation requires processing two threaded holes on the sample and processing two positioning baffles. Fix the positioning baffle on the sample with fastening screws. on, and the fastening screws are easy to sinter at high temperatu...

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