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An adaptive denoising method for Fourier stack microscopy imaging

A micro-imaging and self-adaptive technology, applied in image enhancement, image data processing, instruments, etc., can solve the problems affecting the high-frequency information of the reconstructed image, and meet the requirements of ensuring the reconstruction quality and reducing the brightness of the light source and the use environment requirements, avoiding the effects of

Active Publication Date: 2019-06-07
NANJING UNIV OF SCI & TECH
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Problems solved by technology

[0004] Fourier stack microscopic imaging technology is a new type of large-field high-resolution microscopic imaging technology, but its reconstruction quality is often affected by the noise in the captured low-resolution images, especially those with extremely small signals. , Dark-field images that are easily affected by noise will seriously affect the high-frequency information of the reconstructed image. Therefore, how to effectively remove the noise in the captured image so that it does not affect the final reconstruction quality has become a Fourier stack display. A technical problem that must be overcome in micro-imaging technology

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  • An adaptive denoising method for Fourier stack microscopy imaging
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  • An adaptive denoising method for Fourier stack microscopy imaging

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[0016] In the present invention, the background light image and a group of illumination light images are taken at first, and then all the illumination light images are subtracted from the background light image to obtain a group of no background light images. Then denoise all the dark field images in the non-background light image according to the threshold until the number of non-zero pixels in the dark field image is less than half of the total number of pixels in the image, and obtain a set of dark field noise-free images, and finally calculate the initial solution The ratio of the average value of the generated image to the dark field noise-free image is used to determine whether to update.

[0017] Such as figure 1 As shown, the present invention is aimed at the realization steps of the self-adaptive denoising method of the Fourier stack microscopic imaging technique as follows:

[0018] Step 1, when all the light sources are turned off, take an image as the background l...

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Abstract

The invention discloses an adaptive denoising method for Fourier stacked microscopic imaging technology. First, an image is taken as a background light image Ib when all light sources are turned off, and then each LED unit is lit in sequence and photographed. A set of illumination light images subtracts the background light image Ib from all illumination light images to obtain a set of background-light-free images. All dark-field images in the background-light-free images are denoised according to the threshold Tk, and the threshold Tk is gradually increased from scratch. , until the number of non-zero pixels in the dark field image is less than half of the total number of pixels in the image, and finally a set of dark field noise-free images is obtained. In the iterative process of Fourier stacked microscopy imaging, the image generated by calculating the initial solution is different from the dark field noise-free image. The ratio G of the mean values ​​of the two images of the noise image; if 0.5<G<2, the image is used for update, otherwise the spectrum corresponding to the image is not updated. The invention improves the image quality reconstructed by Fourier stacked microscopic imaging technology, and stably and accurately reconstructs a large field of view and high-resolution image.

Description

technical field [0001] The invention belongs to the field of denoising of microscopic imaging technology, in particular to an adaptive denoising method aiming at Fourier stacked microscopic imaging technology. Background technique [0002] In the field of microscopic imaging, higher resolution has always been the goal of pursuit, but there is a key problem while improving the resolution, that is, the space-bandwidth product of the microscope does not increase with the resolution, in other words, the traditional microscope There is a contradiction between the resolution and the size of the field of view that is difficult to balance at the same time. Because traditional microscopes use low-magnification objective lenses for imaging, the field of view is large but the resolution is low, and when high-magnification objective lenses are used for imaging, the resolution is improved but the corresponding field of view will be reduced. At present, in order to break through the cont...

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06T5/00G06T5/50
CPCG06T5/50G06T5/70
Inventor 陈钱孙佳嵩左超顾国华张玉珍李加基张佳琳
Owner NANJING UNIV OF SCI & TECH
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