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Adaptive de-noising method for Fourier ptychographic microscopy

A microscopic imaging and self-adaptive technology, applied in image enhancement, image data processing, instruments, etc., can solve problems such as high-frequency information affecting reconstructed images, and meet the requirements of ensuring reconstruction quality, avoiding effects, and reducing light source brightness. and the effect of the requirements of the use environment

Active Publication Date: 2016-12-07
NANJING UNIV OF SCI & TECH
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Problems solved by technology

[0004] Fourier stack microscopic imaging technology is a new type of large-field high-resolution microscopic imaging technology, but its reconstruction quality is often affected by the noise in the captured low-resolution images, especially those with extremely small signals. , Dark-field images that are easily affected by noise will seriously affect the high-frequency information of the reconstructed image. Therefore, how to effectively remove the noise in the captured image so that it does not affect the final reconstruction quality has become a Fourier stack display. A technical problem that must be overcome in micro-imaging technology

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  • Adaptive de-noising method for Fourier ptychographic microscopy
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  • Adaptive de-noising method for Fourier ptychographic microscopy

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[0016] In the present invention, the background light image and a group of illumination light images are taken at first, and then all the illumination light images are subtracted from the background light image to obtain a group of no background light images. Then denoise all the dark field images in the non-background light image according to the threshold until the number of non-zero pixels in the dark field image is less than half of the total number of pixels in the image, and obtain a set of dark field noise-free images, and finally calculate the initial solution The ratio of the average value of the generated image to the dark field noise-free image is used to determine whether to update.

[0017] like figure 1 As shown, the present invention is aimed at the realization steps of the self-adaptive denoising method of the Fourier stack microscopic imaging technique as follows:

[0018] Step 1, when all the light sources are turned off, take an image as the background ligh...

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Abstract

The invention discloses an adaptive de-noising method for Fourier ptychographic microscopy, and the method comprises the steps: taking an image under the condition that all light sources are turned off, and enabling the image to serve as a background light image Ib; sequentially turning on all LED units and taking a group of illuminating light images (shown in the description), enabling all illuminating light images to be subtracted by the background light image Ib, and obtaining a group of no-background-light images (shown in the description); carrying out the de-noising operation of all dark field images of the no-background-light images (shown in the description) according to a threshold value Tk, and gradually increasing the threshold value Tk from zero till the number of non-zero pixels in the dark field images is less than the half of the total number of pixels of the images; finally obtaining a group of dark field no-noise images (shown in the description), and calculating the ratio G of the mean values of the images (shown in the description), generated through an initial solution, and the dark field no-noise images in an iterative process of the Fourier ptychographic microscopy; employing the dark field no-noise images for updating if G is greater than 0.5 and less than 2, or else, carrying out no updating of the spectrums corresponding to the dark field no-noise images. The method improves the quality of the image reconstructed through the Fourier ptychographic microscopy, and stably and precisely constructs a large-view-field high-resolution image.

Description

technical field [0001] The invention belongs to the field of denoising of microscopic imaging technology, in particular to an adaptive denoising method aiming at Fourier stacked microscopic imaging technology. Background technique [0002] In the field of microscopic imaging, higher resolution has always been the goal of pursuit, but there is a key problem while improving the resolution, that is, the space-bandwidth product of the microscope does not increase with the resolution, in other words, the traditional microscope There is a contradiction between the resolution and the size of the field of view that is difficult to balance at the same time. Because traditional microscopes use low-magnification objective lenses for imaging, the field of view is large but the resolution is low, and when high-magnification objective lenses are used for imaging, the resolution is improved but the corresponding field of view will be reduced. At present, in order to break through the cont...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06T5/00G06T5/50
CPCG06T5/50G06T5/70
Inventor 陈钱孙佳嵩左超顾国华张玉珍李加基张佳琳
Owner NANJING UNIV OF SCI & TECH
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