Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Large-temperature-zone refrigerating device for satellite normal-pressure thermal test

A refrigeration device and thermal test technology, which is applied to household refrigeration devices, refrigerators, measuring devices, etc., can solve the problem of high test equipment development costs, high test operation costs, affecting the development of satellite atmospheric thermal tests, and unbearable vacuum thermal test costs. and other problems, to achieve the effect of improving equipment utilization, increasing the scope of application, and increasing the cooling speed

Active Publication Date: 2016-11-09
SHANGHAI INST OF SATELLITE EQUIP
View PDF5 Cites 2 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0002] At present, the thermal test of satellites generally adopts the vacuum thermal test, but the development cost of the test equipment and the test operation cost of the vacuum thermal test are extremely high, and with the continuous increase of the envelope size of the satellite, the cost of the vacuum thermal test has become more and more unbearable , the demand for atmospheric pressure heat test began to appear
However, the temperature range of traditional atmospheric thermal test equipment is small, and it is difficult to realize cooling in large temperature zones, which affects the development of satellite atmospheric thermal tests. Therefore, there is an urgent need for economical and efficient large temperature zone refrigeration that can be applied to satellite atmospheric thermal tests. device

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Large-temperature-zone refrigerating device for satellite normal-pressure thermal test
  • Large-temperature-zone refrigerating device for satellite normal-pressure thermal test

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0071] The present invention will be described in detail below in conjunction with the accompanying drawings and specific embodiments.

[0072] combined reference figure 1 and figure 2 , the large temperature zone refrigeration device for satellite atmospheric pressure thermal test provided by the present invention includes: nitrogen system 1, fan in the box 2, control device 3, cascade refrigeration system 4, satellite 5, atmospheric pressure thermal test chamber 6, pressure relief Ventilation device 7; the satellite 5 is placed in the atmospheric pressure thermal test chamber 6, the control device 3 controls the nitrogen system 1, the fan in the box 2, and the cascade refrigeration system 4 to realize refrigeration control, and the control device 3 controls the pressure relief and ventilation device 7 Realize the pressure stability and ventilation in the atmospheric pressure thermal test chamber 6.

[0073] refer to figure 2, the nitrogen system 1 includes a liquid nitr...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a large-temperature-zone refrigerating device and method for a satellite normal-pressure thermal test. The large-temperature-zone refrigerating device for the satellite normal-pressure thermal test disclosed by the invention comprises a nitrogen system, a fan inside a box, a control device, a cascade refrigerating system, a normal-pressure thermal test box and a pressure-relief air interchanger, wherein the control device controls the nitrogen system, the fan inside the box and the cascade refrigerating system to realize refrigerating; and the control device controls the pressure-relief air interchanger to realize pressure stabilization and air interchanging in the normal-pressure thermal test box. The large-temperature-zone refrigerating device adopts a two-stage refrigerating system which is composed of a mixed refrigerant cascade refrigerating system and a nitrogen refrigerating system, can realize a large-temperature-zone working condition from (-) 120 DEG C to the room temperature, can select different refrigerating modes according to different temperature needs, and is stable and efficient.

Description

technical field [0001] The invention relates to the field of refrigeration, in particular to a large temperature zone refrigeration device and method for satellite atmospheric pressure thermal tests Background technique [0002] At present, the thermal test of satellites generally adopts the vacuum thermal test, but the development cost of the test equipment and the test operation cost of the vacuum thermal test are extremely high, and with the continuous increase of the envelope size of the satellite, the cost of the vacuum thermal test has become more and more unbearable , the demand for atmospheric pressure heat test began to appear. However, the temperature range of traditional atmospheric thermal test equipment is small, and it is difficult to realize cooling in large temperature zones, which affects the development of satellite atmospheric thermal tests. Therefore, there is an urgent need for economical and efficient large temperature zone refrigeration that can be app...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): F25B25/00F25B7/00F25D3/10G01M99/00
CPCF25B7/00F25B25/005F25D3/10G01M99/002
Inventor 张世一陈丽谢飞峰沈超冯晨曦
Owner SHANGHAI INST OF SATELLITE EQUIP
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products