System and method for testing digital-analog mixed signal chip

Abstract

The invention discloses a system and a method for testing a digital-analog mixed signal chip. The system comprises a USB communication module, an online detection module, a DAC measurement module, a display alarm module, a linear scanning module and an error processing module, and is characterized in that the modules are all integrated in an ARM processor. The system and the method disclosed by the invention have functions of multi-chip online detection, automatic and manual combination, real-time data recording and storage, system error processing and the like, the hardware cost is saved, and the software design cycle is shortened. Meanwhile, the system and the method can also avoid unstable factors brought about by an externally lapping circuit.

Description

technical field [0001] The invention belongs to the technical field of chip testing, in particular to a chip testing system and method for digital / analog and analog / digital converters. Background technique [0002] With the expansion of product application fields, high requirements are placed on the performance indicators of 12-bit analog-to-digital converters (DAC) and digital-to-analog converters (ADC). Traditional digital / analog and analog / digital chip test systems are limited in operability and poor versatility. Dynamic testing of digital / analog and analog / digital parameters requires external equipment, which is costly; the external circuit is unstable and the test data is not stable. Reliable; there is no special control software test data that needs to be manually recorded, the labor cost and time cost are high, and the repetitive workload is large; there is no more general digital-analog chip test system. [0003] Patent application 201310666255.7 discloses an LCM te...

AI Technical Summary

Problems solved by technology

However, although the application uses the ARM processor for testing, it is not suitable for digital / analog and analog / digital test systems, and the test still requires external equipment, which has a high cost; at the same time, the test data is not reliable

[0004] Therefore, the current D / A and A / D test devices have poor reliability and stability when performing digital-to-analog conversion, and it is difficult to implement dynamic testing. It is necessary to build circuits and external equipment, which reduces the authenticity of test data to a certain extent. Digital / analog and analog / digital module tests need to rebuild the test platform, resulting in poor versatility, and cannot automatically detect whether the chip is online and judge whether the tested chip is in good contact. Only a single chip can be tested, which requires a lot of repetitive labor. The software layered design is relatively simple, the modularization and reusability design is not complete, the coupling between modules is too strong, and the program cannot be transplanted quickly, and each development will cause a serious waste of manpower, material resources and time resources. The maintenance complexity is high, and it is very urgent to design a stable and dynamic digital / analog and analog / digital test system to accurately test and verify that the real performance indicators of digital / analog and analog / digital are provided to designers

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