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Imaging and electrical parameter testing system of transmission-type unit detector

A technology of unit detectors and electrical parameters, applied in the directions of measuring electricity, measuring electrical variables, and testing optical properties, etc., can solve problems such as verification and inability to scan imaging performance at the same time, achieve low cost, strong application and market value, and realize instrumental effect

Inactive Publication Date: 2016-08-17
THE 41ST INST OF CHINA ELECTRONICS TECH GRP
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] Aiming at the problem that existing unit detectors cannot scan imaging and perform performance verification at the same time, the present invention provides a transmissive unit detector imaging and electrical parameter testing system

Method used

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  • Imaging and electrical parameter testing system of transmission-type unit detector

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Embodiment 1

[0020] An imaging operation method of a transmission type unit detector, comprising:

[0021] Step 1: The three-dimensional scanning platform automatically controls the focusing operation, completes the focusing operation of the detector in the direction of the Z axis, uses the motor control to complete the adjustment of the stage and the rotating platform, and the stage rotates to the state where the light source is fully open. When the value collected by the AD sampling module is the maximum, it is confirmed that the system focus is completed;

[0022] Step 2: Place the target object on the stage, the stage motor rotates the target object to the optical path, and the three-dimensional scanning platform uses the X-axis and Y-axis to complete the imaging and scanning of the two-dimensional plane;

[0023] Step 3: Carry out formal imaging to display the acquisition process. The data transmission flow is as follows: the photodetector converts the optical signal on the focal plan...

Embodiment 2

[0026] An operation method for testing electrical parameters of a transmissive unit detector, comprising:

[0027] Step 1: The 3D scanning platform automatically controls the focusing operation, and uses the motor control to complete the adjustment of the stage and the rotating platform, so that the optical fiber light source interface is aligned with the collimator. When the value collected by the AD sampling module is the largest, it is confirmed as The system focus is completed;

[0028] Step 2: The operation interface is in the state of electrical parameter testing. After the system completes the automatic focusing, the formal parameter testing process is carried out. By adjusting the wavelength, power, pulse width and other parameters of the fiber optic light source, it enters the collimator and finally the detector The light source is an optical signal with known parameters.

[0029] The flow direction of data transmission is: the photodetector converts the optical sign...

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Abstract

The invention provides an imaging and electrical parameter testing system of a transmission-type unit detector. The system comprises a shielding case and an upper computer; a spatial light source is arranged in the shielding case, an objective table is arranged under the spatial light source, a rotating platform is arranged under the objective table and provided with a camera lens, a three-dimensional scanning platform is arranged under the rotating platform and connected with a detector, and the detector is connected with a collimator. According to the system, focusing operation on the detector is completed in the Z-axis direction by adopting a three-dimensional scanning array, the imaging scanning process on a two-dimensional plane is completed through an X axis and a Y axis, control is easy, the cost is low, and the real-time collimation work on the focusing position can be completed; meanwhile, unit detector parameter testing including testing on detector property parameters such as the dark currents, the responsivity and the breakdown voltage can be completed through a simple power-adjustable transmission-type optical path.

Description

technical field [0001] The invention relates to the field of unit detectors, in particular to a transmission-type unit detector imaging and electrical parameter testing system. Background technique [0002] With the development of large-area array detectors, there are almost no imaging systems using unit detectors. However, in order to effectively integrate large-array detectors, the performance verification of unit photosensitive units has become a thorny problem. In order to verify the imaging performance of the designed unit detector or external imaging display, the production and development of detectors and the research and development of photosensitive materials often need to design complex and high-cost optical path systems and two-dimensional scanning array platforms. At the same time, they need to be equipped with other systems. The test of the detector parameters is completed, so the current system can only display images without synchronous analysis of the real-ti...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/00G01M11/02
CPCG01M11/02G01R31/00
Inventor 刘磊江升韩顺利闫继送刘加庆吕子敬
Owner THE 41ST INST OF CHINA ELECTRONICS TECH GRP
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