Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Anti-counterfeiting mark encryption method, anti-counterfeiting mark encryption device and manufacturing method of anti-counterfeiting mark encryption device

An anti-counterfeiting mark and encryption method technology, applied in the field of anti-counterfeiting mark encryption device and anti-counterfeiting mark encryption method, can solve the problems of difficult identification, reducing the performance, effect and practicability of anti-counterfeiting, and easy counterfeiting of anti-counterfeiting technology.

Inactive Publication Date: 2016-08-10
何炎权
View PDF10 Cites 2 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] The object of the present invention is to provide an anti-counterfeiting identification encryption method, an anti-counterfeiting identification encryption device and a manufacturing method thereof, which are used to solve the existing anti-counterfeiting technology that is easy to imitate and difficult to identify, which reduces the anti-counterfeiting performance, effect and its effectiveness to varying degrees. Practicality

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Anti-counterfeiting mark encryption method, anti-counterfeiting mark encryption device and manufacturing method of anti-counterfeiting mark encryption device
  • Anti-counterfeiting mark encryption method, anti-counterfeiting mark encryption device and manufacturing method of anti-counterfeiting mark encryption device
  • Anti-counterfeiting mark encryption method, anti-counterfeiting mark encryption device and manufacturing method of anti-counterfeiting mark encryption device

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0036] The following examples are used to illustrate the present invention, but are not intended to limit the scope of the present invention.

[0037] The anti-counterfeit mark encryption method of the present invention utilizes the principle of lens imaging, more specifically, utilizes the principle of imaging of micro-convex lens arrays.

[0038] see figure 1 , firstly, in step S11, a microlens array layer is produced, which includes light-emitting surfaces and layer base surfaces respectively located on both ends of the microlens array layer. Among them, the light-emitting surface is the side for users to observe; the base surface of the layer provides the base surface for setting the anti-counterfeiting layer. The focusing distance of the microlens array layer is controlled so that the focusing distance of the microlens array layer is equal to the distance from the light-emitting surface to the base surface of the layer. Next, in step S12, the anti-counterfeiting layer i...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses an anti-counterfeiting mark encryption method, an anti-counterfeiting mark encryption device and a manufacturing method of the anti-counterfeiting mark encryption device. The anti-counterfeiting mark encryption method and the anti-counterfeiting mark encryption device are used for solving the problems that in the existing anti-counterfeiting technology, counterfeiting is easy, authentication is difficult, and the anti-counterfeiting performance and effect and practicality are reduced to different degrees. The anti-counterfeiting mark encryption method includes the steps that a micro-lens array layer is manufactured, wherein the micro-lens array layer comprises a light-out face and a map layer base face which are located on the two end faces of the micro-lens array layer respectively, and the focusing distance of the micro-lens array layer is controlled to be equal to the distance between the light-out face and the map layer base face; an anti-counterfeiting map layer is arranged on the map layer base face and located on the focusing distance, wherein the anti-counterfeiting map layer comprises a first display region, and the first display region is provided with first anti-counterfeiting mark units matched with array units of the micro-lens array layer in size and position.

Description

technical field [0001] The invention relates to anti-counterfeit encryption technology, in particular to an anti-counterfeit mark encryption method, an anti-counterfeit mark encryption device and a manufacturing method thereof. Background technique [0002] The authenticity of commodities is often valued by consumers. Although its authenticity does not reflect the quality of its products, it is undoubtedly more secure for consumers to purchase products that meet their cognition. As a result, anti-counterfeiting technology has emerged as the times require, and is constantly developing towards high-level encryption anti-counterfeiting. [0003] In the prior art, a variety of anti-counterfeiting technologies and products are included, such as: anti-counterfeiting paper, anti-counterfeiting ink, special printing, laser holographic anti-counterfeiting, network information anti-counterfeiting, microelectronic chip anti-counterfeiting, etc., which all play a certain anti-counterfei...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G09F3/02
CPCG09F3/0294
Inventor 何炎权
Owner 何炎权
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products