Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Food data processing method and system

A processing method, technology of grain, applied in the field of data processing

Inactive Publication Date: 2016-07-27
航天信息软件技术有限公司
View PDF0 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] The main purpose of the present invention is to provide a grain data processing method and system to solve the problem of how to standardize grain data processing in the prior art

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Food data processing method and system
  • Food data processing method and system

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0016] According to an embodiment of the present invention, a method embodiment of a grain data processing method is provided.

[0017] The embodiment of the invention also provides a grain data processing method. The method can be implemented by a grain data processing system, but is not limited thereto.

[0018] figure 1 It is a schematic flowchart of a grain data processing method according to an embodiment of the present invention. Such as figure 1 As shown, the method includes the following steps:

[0019] Step S101, receiving multiple verification parameters of grain;

[0020] In the above-mentioned step S101, the multiple verification parameters of the above-mentioned grains may include moisture parameters, grade parameters, impurity parameters, complete grain rate parameters, etc. of the grains.

[0021] Step S103, judging whether each verification parameter of the grain falls into the preset value range corresponding to each verification parameter of the grain, a...

Embodiment 2

[0058] figure 2 is a schematic structural diagram of a grain data processing system according to an embodiment of the present invention. The architecture depicted is only one example of a suitable environment for descriptive purposes and is not intended to suggest any limitation as to the scope of use or functionality of the application. Nor should the food data processing system be figure 2 Any component or combination shown has any dependencies or requirements.

[0059] Such as figure 2 As shown, the grain data processing system may include: a receiving circuit 21 , a first judging circuit 23 , a calling circuit 25 and a calibration circuit 27 .

[0060] Wherein, the receiving circuit 21 is used to receive multiple verification parameters of the grain;

[0061] In the above-mentioned receiving circuit 21, the plurality of verification parameters of the above-mentioned grains may include moisture parameters, grade parameters, impurity parameters, complete grain rate pa...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a grain data processing method and system. The method includes: receiving a plurality of verification parameters of the grain, judging whether each verification parameter of the grain falls into a preset value interval corresponding to each verification parameter of the grain, obtaining a judgment result, and determining whether each verification parameter of the grain is When the verification parameters fall into the preset value range corresponding to each verification parameter of the grain, the influence factor of each verification parameter of the grain is determined by calling the standard value corresponding to each verification parameter of the grain, according to The impact factor of each verification parameter of the grain is used to calibrate the raw data of the grain stored in advance to generate the calibrated data of the grain. The invention solves the problem of how to standardize the processing of grain data in the prior art.

Description

technical field [0001] The invention relates to the field of data processing, in particular to a method and system for processing grain data. Background technique [0002] At present, in the process of grain purchase, there are many problems in the determination of grain weight and price and the use and management of grain purchase invoices, so the determination of grain weight and price and the use and management of grain purchase invoices are called difficult and key issues in grain purchase . [0003] In the process of traditional grain purchase operations, weight deduction and pricing are very arbitrary, and there are no scientific standards and strict procedures. How to speed up the progress of grain purchase and start-up, reduce farmers' grain sales and waiting time; realize objective sampling, testing, and weighing, avoid favoritism and fraudulent grain, and reduce "round trips" and "roundtrips" for grain sellers and grain collectors The cumbersome process has alway...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G06Q30/04G06Q30/06
Inventor 严红余昔红吕俊杰陈艳宏
Owner 航天信息软件技术有限公司
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com