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FPGA-based frequency meter and frequency measuring method

A frequency meter and measurement result technology, applied in the field of signal measurement, can solve the problems of high cost, complex circuit design, long development cycle, etc., achieve high accuracy and stability, improve measurement accuracy, and reduce errors

Active Publication Date: 2016-06-15
UNIV OF SCI & TECH OF CHINA
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  • Summary
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  • Claims
  • Application Information

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Problems solved by technology

However, compared with the frequency meter based on FPGA design, the development cycle of the custom-made ASIC frequency meter for frequency measurement is longer, the circuit design is complicated, and the cost is high.

Method used

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  • FPGA-based frequency meter and frequency measuring method
  • FPGA-based frequency meter and frequency measuring method

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Embodiment Construction

[0047] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0048] This application provides a frequency meter based on FPGA, such as figure 1 As shown, the frequency meter includes: a clock source 100, a host computer 400, a frequency division shaping unit 300 and a processing unit 200;

[0049] The clock source 100 is connected to the clock signal input end of the processing unit 200 for providing a clock signal for the processing unit 200;

[0050] The frequency division shaping unit 300 is used to receive the exte...

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Abstract

The application provided a FPGA (Field-Programmable Gate Array)-based frequency meter and a frequency measuring method. The frequency meter comprises a clock source, a host computer, a frequency division shaping unit and a processing unit. The frequency meter utilizes the processing unit to perform once rough time measurement on the rising edge of a signal to be measured corresponding to the rising edge of a frequency division signal in each period of the frequency division signal to obtain a first time value, and utilizes the processing unit to perform multiple fine time measurement on the rising edge of the signal to be measured corresponding to the rising edge of a frequency division signal in each period of the frequency division signal, processes the measuring results of the first time value and the multiple fine time measurement, and obtains the frequency of an external original signal based on a first frequency division multiple and a second frequency division multiple. According to the multiple fine time measurement in the frequency measurement process of a whole external original signal, fine time measurement errors are reduced, and the frequency meter measurement precision on the external original signal frequency is improved.

Description

technical field [0001] The present application relates to the technical field of signal measurement, and more specifically, relates to an FPGA-based frequency meter and a frequency measurement method. Background technique [0002] Frequency measurement runs through people's daily life, work and scientific research, and is one of the most basic parameters. With the continuous development of science and technology and the needs of society, especially in the field of wireless communication and electronic technology, people have higher and higher requirements for frequency measurement accuracy. Today's mainstream high-precision measurement of frequency usually uses the time measurement method, which divides the frequency of the signal to be tested to a lower frequency to obtain a frequency-divided signal, and measures the time interval of several frequency-divided signal periods for coarse time and fine time; then combined The total frequency division multiple is calculated to ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R23/10
CPCG01R23/10
Inventor 秦熙王淋荣星于会尧谢一进杜江峰
Owner UNIV OF SCI & TECH OF CHINA
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