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Scanning Ion Conductance Microscope Glass Probe Holder and Illumination Device

A technology of scanning ion conductance and lighting device, which is applied in the field of glass probe clamping and lighting device, can solve the problems of affecting the performance of scanning ion conductance microscope, reducing the shielding effect of the box, and difficulty in placing light sources, etc., and achieves reliable clamping and structure. Compact, cost-reducing effect

Active Publication Date: 2017-11-24
SICHUAN UNIV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Different from the patch clamp measurement, the scanning ion conductance microscope probe and the inverted microscope stage are perpendicular to each other, so that the top light source of the inverted microscope cannot irradiate the light to the probe tip through the existing probe holder, and an external light source must be used To increase the brightness of the field of view of an inverted microscope to observe the entry of glass microprobe tips into the workspace
However, in order to improve the anti-interference ability of the scanning ion conductance microscope measurement system, the three-dimensional scanning head of the scanning ion conductance microscope is usually placed in a shielded box, and the narrow space makes it difficult to place a light source inside it. Open the shielding box door and irradiate the probe tip obliquely to observe the probe tip entering the working area
This reduces the shielding effect of the cabinet to a certain extent, and also affects the performance of the scanning ion conductance microscope
In addition, the electrical socket and the base of the existing glass probe holder are fixedly connected together, cannot be disassembled, and are expensive
When the Ag / AgCl electrode wire is broken, it must be replaced with a new glass probe holder

Method used

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  • Scanning Ion Conductance Microscope Glass Probe Holder and Illumination Device

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Embodiment Construction

[0013] An embodiment of the present invention is given below in conjunction with the accompanying drawings, and the present invention will be further described through the embodiment. It should be pointed out that the specific implementation of the present invention is not limited to the forms described in the examples.

[0014] refer to figure 1 , figure 2 , The present invention is a glass microprobe clamping and illuminating device for a scanning ion conductance microscope, which is composed of a probe clamping module and a light source system. The clamping module is mainly composed of the base (1), the fastening sealing ring (2) installed in the bottom cavity of the base, the pipe cap (3) which is fixedly connected with the lower end of the base through the thread, and the upper left end of the base through the thread. The electrical connector seat (12) with the side hole fixedly connected, the sealing ring (10), the contact pin (11) fixed in the plug, and the Ag / AgCl e...

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Abstract

The invention provides a scanning ion conductance microscopy (SICM) glass probe clamping and illuminating device. The device mainly comprises a clamping module used for fixing a glass microprobe and a light source system used for illumination during SICM scanning measurement. The clamping module is mainly constituted by a device substrate, a sealing ring disposed in the cavity disposed in the bottom part of the substrate, a pipe cap fixedly connected with the lower end of the substrate by threads, an electric plug seat fixedly connected with the left side hole of the upper end of the pedestal by the threads, a sealing ring, an inserting pin fixedly disposed in the plug seat, and an Ag / AgC1 wire electrode connected with the inserting pin by adopting the welding connecting technology. The light source system is constituted by a lens fixedly disposed on the top end of the substrate, a battery seat fixedly connected with the top end of the substrate by the threads, a high light LED fixedly disposed on the bottom part of the battery seat, a button battery disposed in the battery seat, and a switch fixedly disposed on the top part of the battery seat. The device provided by the invention is advantageous in that the structure is simple and compact, the integration degree is high; the reliable clamping of the glass microprobe can be realized, and the device can be used for the illumination during the SICM scanning measuring process, and then the condition of the tip end of the probe entering the working area can be observed; the optimizing of the structure of the scanning ion conductance microscopy can be facilitated, and the efficiency of the glass probe entering the working area can be increased.

Description

technical field [0001] The invention relates to a glass probe clamping and illuminating device of a scanning measuring instrument SICM for the surface topography of living cells, and belongs to the technical field of scanning probe microscopy. Background technique [0002] Scanning ion conductance microscopy monitors the ionic current passing through the glass probe in real time, and negative feedback controls the distance between the probe tip and the sample surface, so as to achieve real-time, continuous, non-contact, high-resolution imaging of the surface microstructure of living cells. It has a very broad application prospect in the field of cell detection and soft interface research. Currently, scanning ion conductance microscopes use patch clamp electrode holders to fix glass microprobes. Different from the patch clamp measurement, the scanning ion conductance microscope probe and the inverted microscope stage are perpendicular to each other, so that the top light sou...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01Q60/44G01Q70/00
CPCG01Q60/44G01Q70/00
Inventor 陆小龙赵世平温慧婷司姗姗王越夏京川祁正兴宋国堃
Owner SICHUAN UNIV
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