Automatic ringing signal test system, method and device

Abstract

The invention discloses an automatic ringing signal test system, method and device. The system comprises a control terminal, a test device and a tested device; the test device comprises a control module and FXO interfaces, and chips of the FXO interfaces are capable of measuring the voltage; the tested device comprises FXS interfaces which are connected with the FXO interfaces in one to one correspondence; the control terminal controls the calling FXO interface to call the called FXO interface via the control module; when the FXS interface corresponding to the called FXO emits a ringing signal, the control module reads the voltage measuring value of the called FXO interface, generates corresponding sampling data, and sends the sampling data to the control terminal; and the control terminal also analyzes the received sampling data and determines whether the sampling data is qualified. According to the invention, the ringing signals are automatically sampled and analyzed to determine whether the ringing signals are normal, and determining is accurate and efficient.

Description

technical field [0001] The invention relates to a ringing signal automatic test system, method and device. Background technique [0002] The External Exchange Station (FXS) interface is widely used in telephone exchange systems to connect various types of telephones, fax machines, modems and other terminal equipment to provide feed and ringing signals for terminal equipment. The ringing signal is used to notify the terminal device that there is an incoming call operation, and the terminal device such as a telephone is driven by the ringing signal to generate a ringing sound. The standard ringing signal should be a sinusoidal waveform with a frequency of 20-30Hz and a peak-to-peak value greater than 120V. When the frequency of the ringing signal exceeds the normal range, the amplitude is too small, and the waveform is seriously deformed, the phone will ring abnormally. [0003] The current FXS interface is usually implemented using an integrated circuit SLIC (subscriberline...

AI Technical Summary

Problems solved by technology

During the production process of the equipment, it was found that the SLIC chip or the resistors and capacitors used in the periphery have a certain probability of quality problems or welding problems, causing the ringing signal to be deformed, so that the ringing sound of the telephone cannot ring normally when the user uses it. The phenomenon

[0004] The FXS interface detection technology used in the past can only judge whether the SLIC chip sends a ringing signal, but cannot judge whether the ringing signal is intermittent or deformed

With the method of manual testing, it is very subjective to judge whether it is normal by listening to the ringing sound with the human ear, and it greatly increases the workload of the test and reduces the production efficiency.

Using an oscilloscope to measure the ringing signal can accurately find the FXS interface with an abnormal ringing signal, but the operation is complicated and not operable

Images