A high-precision probe loading device for pcb automatic test equipment

Abstract

The invention specifically provides a high-precision probe loading device used for a PCB automatic testing device and solves the problems that an existing probe loading device is complex in mechanical structure, small in probe stroke and probe pressure adjusting range and low in loading precision. A support is arranged on the surface of a mover body. A linear motor is fixed at one side of the support. The other side of the support is provided with a driving wheel and a driven wheel. A transmission belt is arranged between the driving wheel and the driven wheel. A sliding block is arranged on the transmission belt. The sliding block is provided with an insulating block. The lower end of the insulating block is provided with a probe assembly. The probe assembly comprises a sleeve. A probe is arranged in the sleeve in a penetrating manner. The tail part of the probe is abutted against a stepped positioning block. The tail part of the stepped positioning block is sleeved by a buffering spring. The probe is composed of a probe body and a probe sleeve, and the probe sleeve is internally provided with a steel ball. A probe buffering spring is arranged between the steel ball and the tail part of the probe body. The probe body and the side wall of the probe are respectively provided with an anti-falling boss. By adopting the high-precision probe loading device, a loading precision index of a tested point is ensured.

Description

technical field [0001] The invention relates to a probe loading device, in particular to a high-precision probe loading device for PCB automatic testing equipment. Background technique [0002] In the circuit board automatic test system, the instrument realizes the test by contacting the test point on the circuit board under test with the probe controlled by the computer to extract the signal; the usual circuit board automatic test equipment (such as flying probe tester, etc.) consists of more than one Probe component composition; when the test equipment is working, the action of probe loading can be decomposed into the action of the probe displacement positioning (usually referring to the X / Y direction) mechanism and the probe assembly controlling the loading of the probe in the vertical direction (usually referring to the Z direction) Actions. [0003] The existing probe loading device has problems such as complex mechanism, small probe height and loading pressure range, ...

AI Technical Summary

Problems solved by technology

[0004] The present invention provides a high-precision probe loading device for PCB automatic testing equipment in order to solve the problems of complex mechanical structure, small adjustment range of probe stroke and probe pressure and low loading accuracy existing in the existing probe loading device.

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