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Z-scanning device for middle-infrared band being 3-5 micrometers

An infrared band and scanning device technology, which is applied in the field of devices for measuring nonlinear materials, can solve problems such as drawing graphics, inconvenient research, difficult confocal length of laser beam divergence angle, and accurate measurement of energy fluctuations, so as to improve accuracy and stability High performance, simple structure, and convenient handling

Active Publication Date: 2016-01-20
西安斯谱光电技术有限公司
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AI Technical Summary

Problems solved by technology

[0003] However, the conventional Z-scanning device detects the laser beam only for a specific wavelength, and it is difficult to detect the divergence angle and beam waist radius of the multi-wavelength (wavelength can be tuned in a wide range) laser beam in the 3-5 μm mid-infrared band. , confocal length, and energy fluctuations for precise measurement
In addition, due to the inability to analyze the beam quality of the continuously tunable laser beam, the commonly used Z-scanning device cannot process the test data and draw graphics, which brings great inconvenience to the research

Method used

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  • Z-scanning device for middle-infrared band being 3-5 micrometers
  • Z-scanning device for middle-infrared band being 3-5 micrometers

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Embodiment Construction

[0025] In a basic embodiment, a 3-5 μm mid-infrared band Z-scanning device is provided, the device comprising:

[0026] M100, light intensity acquisition module: the light intensity acquisition module includes CaF 2 Spectroscope, CaF 2 beam waist forming mirror, first probe, second probe;

[0027] The CaF 2 The beam splitter is 45° to the horizontal direction, and the incident light is divided into two beams of transmitted light and reflected light; the incident light is a laser beam in the mid-infrared band of 3-5 μm;

[0028] The first probe is used to collect the reflected light intensity, and convert the light intensity into an electrical signal and send it to the scanning controller of the scanning control module;

[0029] The second probe is used to collect CaF 2 The beam waist generates the light intensity of the transmitted light incident on the sample to be tested and transmitted through the sample to be tested after the mirror, and converts the light intensity in...

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Abstract

The invention provides a Z-scanning device for a middle-infrared band being 3-5 micrometers. The device comprises a CaF2 light splitter, a CaF2 beam waist generator mirror, a first probe, a second probe, a scanning controller, a PCI card, an electric translation platform, a single chip microcomputer, and a PC and can be used for accurately measuring the quality of the light beam in a 3-5-micrometer waveband emitted by a laser and the laser beam focusing position; the two-dimensional Z-scanning experiment of a sample in a 3-5-micrometer wavelength can be implemented. The experiment device has a simple structure, facilitates the processing of the measurement result, and can be widely applied to the research fields of non-linear optical measurement, non-optical information processing, optical devices and the like.

Description

technical field [0001] This patent relates to a device for measuring the nonlinearity of materials by optical means, which can accurately measure the beam quality and beam focus position in the wavelength band, and can also carry out two-dimensional Z-scanning within the wavelength tunable range of 3-5 μm. The invention belongs to the fields of nonlinear optical materials and nonlinear optical information processing. Background technique [0002] Nonlinear optical materials have been paid more and more attention due to their broad development prospects in optical switches, laser protection materials and optical information processing. The measurement technology of nonlinear optical properties of materials has also become a research hotspot. The laser Z-scanning method has become the main method for characterizing the nonlinear optical properties of nonlinear optical materials due to its convenient operation and high sensitivity. [0003] However, the conventional Z-scanning...

Claims

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Application Information

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IPC IPC(8): G01N21/39
Inventor 白杨张泽南
Owner 西安斯谱光电技术有限公司
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