Bi-directional shearing speckle interference system based on spatial carrier and measurement method

Abstract

The invention discloses a bi-directional shearing speckle interference system based on spatial carrier and a measurement method. The system is characterized in that different-wavelength emergent light of a first light source and a second light source irradiates a measuring surface at the same time after beam expanding; diffuse reflection light of the measuring surface passes through an imaging lens, a diaphragm, a 4f system and a beam splitter prism and is divided into two beams of light; the two beams of light pass through filters and become two light beams with single wavelength, and the two light beams respectively pass through two Michelson shearing apparatuses so as to realize introduction of shearing displacement at different directions; and light with two different shearing directions passes through the beam splitter prism and irradiates on a CCD target surface. The measurement method can carry out bi-directional synchronous detection on defect of a measured object and is a nondestructive, whole-field and high-efficiency measurement method.

Description

technical field [0001] The invention relates to a two-way shear speckle interference system and measurement method based on a space carrier, which can simultaneously detect defects of a measured object from two measurement directions, and is especially suitable for non-destructive detection of near-surface defects of composite materials in aerospace. Background technique [0002] Shear speckle interferometry is a full-field, non-contact, high-sensitivity optical measurement technology. Because it can directly measure the derivative of object deformation, it eliminates the rigid displacement of the measured object during the measurement process. The inhomogeneous abrupt change of the is highlighted in the form of fringe distortion of the phase map. In addition, shear speckle interferometry has the advantages of simple optical path device, good shock resistance and low requirements on the measurement environment, making it widely used in the field of industrial non-destructive...

AI Technical Summary

Problems solved by technology

However, the method of multiple inspections cannot guarantee the consistency of the deformation of the measured object, which brings difficulties to the subsequent unified quantitative processing of various defects.

Although it is also possible to use multiple unidirectional shear speckle interference systems to measure the measured object simultaneously, this will increase the complexity of the measurement process, and it is difficult to accurately match the measurement information between the various systems

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