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Ion electric propulsion beam doubly charged ion testing device and assembling method thereof

A test device, ion electric technology, applied in the direction of measuring device, assembly machine, radiation measurement, etc., can solve the problem of double-charged ion test without ion electric propulsion beam

Active Publication Date: 2015-11-04
LANZHOU INST OF PHYSICS CHINESE ACADEMY OF SPACE TECH
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

Before the invention of the test device, there was no mature technology and test device for ion electric propulsion beam double-charged ion test in China

Method used

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  • Ion electric propulsion beam doubly charged ion testing device and assembling method thereof
  • Ion electric propulsion beam doubly charged ion testing device and assembling method thereof
  • Ion electric propulsion beam doubly charged ion testing device and assembling method thereof

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Embodiment Construction

[0064] The present invention will be described in detail below with reference to the accompanying drawings and examples.

[0065] figure 1 It is a schematic diagram of the ion electric propulsion beam double-charged ion testing device of the present invention. like figure 1 (a)~ figure 1 As shown in (c), the test device includes an outer casing, a collimation sleeve 1, a drift tube 3, a permanent magnet 4, an electrode plate 5, an ion current collection cup 9 and a small hole assembly. The outer shell is a cuboid, consisting of a front side plate 12, a rear side plate 15, an upper bottom plate, a lower bottom plate, a left side plate and a right side plate. The upper and lower bottom plates are embedded inside the left and right side plates (see figure 1 (b)) to form a square tube, and the front and rear side panels serve as the cover for the openings at both ends of the square tube (see figure 1 (c)).

[0066] The internal electric field and magnetic field of the device ...

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Abstract

The invention discloses an ion electric propulsion beam doubly charged ion testing device and an assembling method thereof, and can provide a magnetic field and an electric field, so as to realize testing of doubly charged ions in a beam. The device includes an outer shell, a collimation sleeve, a drifting tube, permanent magnets, electrode plates, an ion current collecting cup and a small hole assembly; the small hole assembly includes three small hole parts, and each has multiple sets of spare components which are the same in shape and have small inner holes with different apertures; and during testing, the spare component with the required aperture is selected according to intensity of a measured signal and a test resolution requirement to be mounted, thus adjustment of the test resolution can be realized through replacement of a small hole set, thereby enabling an adaptive range of the device to be expanded. Through the design of adjusting components and fixed components, parallelism between the permanent magnets, parallelism between the electrode plates and perpendicularity between the permanent magnets and the electrode plates are realized, thereby ensuring directions of the magnetic field and the electric field. The ion electric propulsion beam doubly charged ion testing device adopts a relation transformation method, thereby enabling an assembling process to be simpler and more convenient, and enabling an assembling result to be more accurate.

Description

technical field [0001] The invention relates to the technical field of ion electric propulsion beam double-charged ion testing, in particular to an ion electric propulsion beam double-charged ion testing device and an assembly method thereof. Background technique [0002] In the development and engineering application of ion thruster products, it is of great significance to test and analyze the beam characteristics. Through the test and analysis of the ratio of double-charged ions in the beam, important performance parameters of the ion thruster can be obtained, which provides an important reference for optimizing the design of the ion thruster. [0003] The doubly charged ions in the ion thruster beam account for a certain proportion, which is mainly related to factors such as the internal magnetic field of the thruster, the plasma characteristics of the discharge chamber, and the ionization of the working gas. The ratio of double-charged ions reflects important informatio...

Claims

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Application Information

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IPC IPC(8): G01T1/29B23P21/00
Inventor 唐福俊张天平顾左崔铁民江豪成梁凯
Owner LANZHOU INST OF PHYSICS CHINESE ACADEMY OF SPACE TECH
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