Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Time jittering delay measuring device and method based on non-linear correlation detection

A non-linear correlation, time jitter technology, applied in the direction of instruments, etc., can solve the problem of difficult to reach the ps level measurement level, and achieve the effect of simple structure and high resolution

Inactive Publication Date: 2015-11-04
BEIJING INST OF RADIO METROLOGY & MEASUREMENT
View PDF5 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] The technical problem to be solved by the present invention is to provide a time jitter delay measurement device and method based on nonlinear correlation detection, which solves the problem of high resolution in the field of high precision time synchronization. Key Issues in Timing Jitter Delay Measurement

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Time jittering delay measuring device and method based on non-linear correlation detection
  • Time jittering delay measuring device and method based on non-linear correlation detection

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0033] In order to explain this more clearly invention , The following combination of preferred embodiments and Attached drawing To this invention Give further explanation. In the attached picture Similar parts with the same Attached drawing Mark to indicate. Those skilled in the art should understand that the content described below is illustrative rather than restrictive, and should not be used to limit the content. invention The scope of protection.

[0034] The invention discloses a time jitter delay measurement device based on nonlinear correlation detection. The device includes a first mirror 1, a time delay line 2, a first half mirror 3, a second mirror 4, and a first focus The mirror 5, the nonlinear frequency doubling crystal 6, the second focusing mirror 7, the filter 8 and the photoelectric probe 9, as well as the first pulse input interface A1 and the second pulse input interface A2 to be measured.

[0035] The first pulse 10 to be measured is input to the measur...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a high-resolution time jittering delay measuring device and method based on non-linear correlation detection. The device comprises a first to-be-measured pulse input interface, a second to-be-measured pulse input interface, a time delay line, a non-linear frequency multiplication crystal and a photoelectric probe, wherein the time delay line and the non-linear frequency multiplication crystal are successively arranged in a first pulse spreading path, the non-linear frequency multiplication crystal is also arranged in a second pulse spreading path, the non-linear frequency multiplication crystal generates frequency multiplication related pulses based on first and second to-be-measured pulses, and the photoelectric probe collects the frequency multiplication related pulses. According to the technical scheme of the invention, high-resolution time jittering delay can be measured in the field of high-precision time synchronization, the measuring precision can reach 1ps, and the device and method are also characterized by high resolution and simple structure.

Description

technical field [0001] The invention relates to time delay measurement, in particular to a time jitter delay measurement device and method based on nonlinear correlation detection. Background technique [0002] With the rapid advancement of networking and informationization and the rapid development of sophisticated weapons and equipment, precise navigation and guidance, distributed radar systems, space detection, laser fusion technology, phased array antenna technology, high-performance atomic clock time comparison, free The advanced information technology fields and cutting-edge scientific fields represented by electronic lasers have continuously improved the evaluation and calibration requirements for high-precision time synchronization and its performance, from the original millisecond, microsecond, and sub-microsecond levels to the current nanosecond, sub-microsecond levels. Nanosecond or even sub-picosecond level, which brings new difficulties and challenges to high-pr...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G01J11/00
Inventor 石凡张升康尚怀赢易航年丰冯克明
Owner BEIJING INST OF RADIO METROLOGY & MEASUREMENT
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com