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Polycrystal minority carrier lifetime detection back lineation measuring tool

A low-lifetime and post-testing technology, applied in the direction of manufacturing tools and workshop equipment, can solve the problems of heavy workload, reduced work efficiency, time-consuming and labor-intensive operation, etc., and achieve the effect of reasonable structure, improved work efficiency, and low requirements for operators

Inactive Publication Date: 2015-10-14
SHANDONG DAHAI NEW ENERGY DEV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

This method has a large workload, time-consuming and labor-intensive operation, and greatly reduces work efficiency.

Method used

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  • Polycrystal minority carrier lifetime detection back lineation measuring tool
  • Polycrystal minority carrier lifetime detection back lineation measuring tool
  • Polycrystal minority carrier lifetime detection back lineation measuring tool

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0018] as attached Figure 1-3 As shown, the polycrystalline minority-carrier life-span test scribe measuring tool includes a wooden base 1, and a scale 2 attached to the wooden base 1 is connected to the front end of the wooden base 1, and the upper and lower ends of the scale 2 are connected One side of the front part of the corresponding wooden base 1 is respectively provided with a groove 3, and a square 4 is respectively slid up and down in the groove 3; There is a first fastening screw 5 penetrating into the fixed square 4 in the groove.

[0019] The four corners of the scale 2 are respectively provided with a second fastening screw 6 , and the scale 2 is fixedly connected with the front end of the wooden base 1 through the second fastening screw 5 .

Embodiment 2

[0021] as attached Figure 4-5 As shown, it is another embodiment of the present invention. The difference between the scribing measuring tool after the minority carrier lifetime detection and the embodiment 1 is that the back of the scale 2 and the front end of the wooden base 1 are bonded and fixed by an adhesive 7. even.

[0022] Hereinafter, taking a certain squared silicon ingot as an example, the method of using the scribing measuring tool after polycrystalline minority carrier lifetime testing in Embodiment 1 and Embodiment 2 of the present invention is described. Divide the silicon ingot into 5*5 pieces of silicon blocks with a size of 156*156 in total, and divide them into A area (9 blocks) / B area (12 blocks) / C (4 blocks) according to the position of the silicon block in the silicon ingot. block), select each silicon block in each area for minority carrier lifetime detection, and mark the head and tail unqualified areas according to the test results of silicon blocks...

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Abstract

The invention relates to a polycrystal minority carrier lifetime detection back lineation measuring tool. The polycrystal minority carrier lifetime detection back lineation measuring tool comprises a wood base, wherein the front end of the wood base is connected with a dividing ruler bonded with the wood base; grooves are respectively formed in one side of the front part of the wood base corresponding to the upper and lower ends of the dividing ruler; right-angled rulers are respectively arranged in the grooves in a vertical sliding manner; and first fastening screws for fixing the right-angled rulers are respectively arranged at the two ends of the bottom edges of the right-angled rulers corresponding to the back part of the wood base. The polycrystal minority carrier lifetime detection back lineation measuring tool has the advantages of reasonable structure, convenience, practicability, simple operation, time and labor saving, precise lineation, low workload and capability of improving the working efficiency.

Description

(1) Technical field [0001] The invention relates to a scribing measuring tool after polycrystalline minority carrier lifetime detection. (2) Background technology [0002] The solar polysilicon ingot is a columnar crystal. The growth direction of the crystal is vertically upward, and the direction of heat flow is vertically downward. It is required that the temperature gradient at the solid-liquid interface is greater than 0, and there is no temperature gradient in the transverse plane, thus forming a directionally solidified columnar crystal. The edge of the silicon ingot is cut off by a square cutting machine, and the unqualified part of the head and tail of the silicon ingot is cut off according to the minority carrier lifetime test. The silicon ingot is taken out of the crucible and squared. 25 silicon blocks with a size of 156*156. The silicon blocks after the prescription need to be tested for the minority carrier life, and the unqualified parts at the head and tail a...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): B25H7/04
CPCB25H7/045
Inventor 陈文杰甘大源薛东波韩志纯刘海军
Owner SHANDONG DAHAI NEW ENERGY DEV
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