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Device for grinding ultrasonic wave guide probe

A technology of ultrasonic and sliding rails, which is used in material analysis, measuring devices, and grinding machines using sonic/ultrasonic/infrasonic waves. It can solve problems such as uneven force, scrapped probes, and irregular shapes to ensure accurate positioning and enhance stability. function, the effect of prolonging the service life

Active Publication Date: 2015-09-30
STATE GRID CORP OF CHINA +2
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

In the past, the circular-arc grooves were often ground by hand, and there was uneven force, and it was easy to cause the ground circular-arc grooves to be skewed and irregular in shape. Therefore, during the detection process, the surface of the probe and the pipe wall could not be effectively connected. Contact, the detection defect cannot be accurately located, which affects the detection result and leads to the scrapping of the probe

Method used

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  • Device for grinding ultrasonic wave guide probe

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Embodiment Construction

[0022] The present invention is further described in conjunction with the following examples.

[0023] The embodiment of the present invention provides a device for grinding the ultrasonic guided wave probe, which is used for grinding the probe 8, such as figure 1 As shown, it includes a base 1, a column 2, a cantilever 3, a probe fixture 4, a slide rail base 5, a V-shaped sample tube fixing groove 6 and a sample tube fixing card 7.

[0024] The base 1 is located at the lower part of the device, and an adjustment member that can adjust the level of the base 1 is arranged below it, and the adjustment member is vertically arranged with the base 1 . The upright column 2 is arranged on one side above the base 1 , preferably, the upright column 2 is perpendicular to the base 1 , and the upright column 2 is fixedly connected to the base 1 through the bolt holes arranged above the base 1 . One end of the cantilever 3 is clamped on the column 1, and it can slide vertically up and dow...

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Abstract

A device for grinding an ultrasonic wave guide probe comprises a base, a stand column, a suspension arm, a probe clamp, a sliding guide rail base, a V-shaped sample tube fixing tank and a sample tube fixing clamp, wherein the base is provided with adjustment components for adjusting the level of the base; the stand column is fixedly connected on one side of the base; one end of the suspension arm is clamped on the stand column and can slide up and down along the stand column; the probe clamp is fixed at the other end of the suspension arm and connected with a probe when used; the sliding guide rail base is arranged on the other side of the base, and machining sliding rails are arranged on the sliding guide rail base; the V-shaped sample tube fixing tank is mounted right above the sliding guide rail base, the top of the V-shaped sample tube fixing tank is used for accommodating a tube with the diameter identical to that of a required ground probe, and lower sliding rails in fit connection with the machining sliding rails are arranged at the bottom of the V-shaped sample tube fixing tank; the sample tube fixing clamp is arranged above the V-shaped sample tube fixing tank and penetrates through the tube arranged on the V-shaped sample tube fixing tank, two ends of the sample tube are fixed on outer sides of the V-shaped sample tube fixing tank, the sample tube fixing clamp is matched with the V-shaped sample tube fixing tank to fix the tube, and accordingly, the tube can be prevented from shaking in the probe grinding process.

Description

technical field [0001] The invention relates to the field of non-destructive testing, in particular to a device for grinding ultrasonic guided wave probes. Background technique [0002] Ultrasonic testing is one of the five conventional nondestructive testing techniques. At present, it is a kind of non-destructive testing technology that is widely used at home and abroad, with the highest frequency and rapid development. Ultrasonic guided wave testing technology uses low-frequency torsional waves or longitudinal waves to perform long-distance testing of pipelines and pipelines, including long-distance testing of underground pipes without excavation. [0003] The ultrasonic guided wave probe is an important part of the ultrasonic guided wave inspection system. When ultrasonic guidance is used for defect detection, it is in direct contact with the pipeline and is used to excite and receive ultrasonic guided waves in the pipeline. [0004] The ultrasonic guided wave probe is ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): B24B23/00B24B27/00G01N29/24
CPCB24B23/00B24B27/00G01N29/24
Inventor 艾红赵建平徐强张龙张斯文王亮马树润刘阳徐凯毛民·阿斯哈尔游溢王建
Owner STATE GRID CORP OF CHINA
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