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Spatial sampling method and device

A technology of spatial sampling and sampling points, which is applied in image data processing, instrumentation, calculation, etc., and can solve problems such as difficulty in ensuring the reliability of evaluation results.

Active Publication Date: 2017-12-01
珠海中科先进科技产业有限公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] The embodiment of the present invention provides a spatial sampling method and device, aiming to solve the problem that the existing methods are difficult to guarantee the reliability of the evaluation results

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  • Spatial sampling method and device

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Embodiment 1

[0025] figure 1 A flow chart of a spatial sampling method provided by the first embodiment of the present invention is shown, and the details are as follows:

[0026] Step S11, dividing the total sample size into grids of the same size according to a preset scale.

[0027] In this step, before the sampling starts, the total sample size needs to be determined first, for example, the land use vector data map of Central Asia is used as the total sample size, figure 2 It shows a schematic diagram of dividing a certain region into 841 grids of the same size. When the vector data graph is extremely large, it is almost impossible to obtain exact sampling information, so it is necessary to sample the vector data graph. The preset scale may be a grid with a scale of 100 km×100 km, and of course, other scales may also be used, which is not limited here.

[0028] Step S12, determining the fractal dimension of the divided grid.

[0029] In this step, the fractal dimension of the grid...

Embodiment 2

[0065] image 3 A structural diagram of a spatial sampling device provided by the second embodiment of the present invention is shown, and for convenience of description, only parts related to the embodiment of the present invention are shown.

[0066] The space sampling device includes: a grid division unit 31 , a fractal dimension determination unit 32 , a sampling point number determination unit 33 , a sampling point position determination unit 34 , and a sampling point extraction unit 35 . in:

[0067] The grid division unit 31 is configured to divide the total sample size into grids of the same size according to a preset scale.

[0068] Wherein, the preset scale may be a grid with a scale of 100 km×100 km, of course, it may also be other scales, which are not limited here.

[0069] The fractal dimension determining unit 32 is configured to determine the fractal dimension of the divided grid.

[0070] Among them, the fractal dimension of the grid mainly refers to the fr...

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Abstract

The present invention is applicable to the field of space sampling, and provides a space sampling method and device. The method includes: dividing the total sample size into grids of the same size according to a preset scale; determining the fractal dimension of the divided grids ; Determine the number of sampling points to be extracted from each grid according to the determined fractal dimension; determine the position of the sampling point according to the determined fractal dimension of the grid and the determined number of sampling points; The location extracts the corresponding sampling points. The embodiments of the present invention can ensure unbiased sampling.

Description

technical field [0001] Embodiments of the present invention belong to the field of space sampling, and in particular, relate to a space sampling method and device. Background technique [0002] The purpose of spatial sampling survey is to understand the whole through the characteristic value of the individual. In actual work, converting the real spatial distribution into sampling samples does not mean that the more and more refined the size effect is, the more likely it is to eliminate the size effect, but it is necessary to obtain different levels of supply and demand through experiments or other research methods in order to select suitable individuals sample. [0003] In the existing sampling methods, people often only pay attention to the patch complexity of a certain region, that is, in the process of specific space sampling, people often pay attention to local features, but ignore the overall global characteristics. Since the overall layout characteristics are ignored...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06T7/00
Inventor 钱静彭树宏郑茂恭
Owner 珠海中科先进科技产业有限公司
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