Evaluation Method of Non-parallel Storage Life Test Based on Feasible Region Selection of Acceleration Factor
A technology of storage life test and acceleration factor, which is applied in special data processing applications, instruments, electrical digital data processing, etc., and can solve problems such as product performance degradation and errors
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[0094] The present invention will be further described in detail below in conjunction with examples.
[0095] Preliminary work of the present invention:
[0096] The life of a stored gyro obeys the Weibull distribution, and a timed censored accelerated life test is performed to evaluate its life. The storage time is shown in Table 1.
[0097] The storage temperature is 20°C, and the test temperatures are 45°C, 57°C, 69°C, and 80°C, respectively.
[0098] The acceleration model is the Arrhenius model:
[0099] η = Aexp(E / kT) (10)
[0100] Where A is a positive constant, E is the activation energy, k=1.38×10 -23 J / K, is the Boltzmann constant.
[0101] Taking the logarithm on both sides, we can get
[0102] lnη=a+bx
[0103] where a=lnA, Therefore, the logarithm of the characteristic lifetime is a linear function of the inverse of temperature.
[0104] The test data are shown in Table 1.
[0105] Table 1 Test data
[0106]
[0107]
[0108] Note: d means days. ...
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