Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Point cloud smoothing system and method

A smooth and point cloud technology, applied in image data processing, special data processing applications, 3D modeling, etc., can solve problems affecting measurement results

Active Publication Date: 2015-04-29
UR MATERIALS IND SHENZHEN CO LTD
View PDF7 Cites 2 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Especially when the obtained point cloud data is scattered and disordered three-dimensional discrete point cloud data, if the point cloud data is not processed, the measurement results will be seriously affected

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Point cloud smoothing system and method
  • Point cloud smoothing system and method
  • Point cloud smoothing system and method

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0016] Such as figure 1 Shown is a hardware architecture diagram of a preferred embodiment of the point cloud smoothing system of the present invention. The point cloud smoothing system 10 is applied to an electronic device 1, and the electronic device 1 may be a computer, a server, a programmable logic controller (Programmable Logic Controller, PLC), a measuring machine, or other electronic devices with computing capabilities .

[0017] In this preferred embodiment, the point cloud smoothing system 10 is used to perform gridding processing, noise point filtering and smoothing processing on the point cloud data of products, so as to ensure the accuracy of the point cloud data. For specific processing procedures, see below for image 3 Detailed description of the flowchart shown.

[0018] The electronic device 1 further includes a processor 11 , a storage device 12 and a display device 13 . The processor 11 is used to execute the point cloud smoothing system 10 and various ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

A computing device and a method processes a point cloud of an object. The computing device constructs a curved surface according to the point cloud and triangulates the curved surface using a plurality of triangles. The computing device simulates each marked adjacent point and neighborhood points to a predetermined surface using a predetermined algorithm. The computing device projects each marked adjacent point onto a predetermined surface to obtain a projected point according to the type of the marked adjacent point.

Description

technical field [0001] The invention relates to the field of product processing, in particular to a point cloud smoothing system and method. Background technique [0002] Improving and ensuring product quality is an important part of corporate activities. In order to improve and guarantee product quality, it is essential to carry out product inspection. Through inspection activities, the quality information of the product and its manufacturing process is provided, and the manufacturing process of the product is controlled, corrected and compensated according to this information, so that waste is eliminated. The rate of products and repaired products is reduced to a minimum, ensuring the stability of the product quality formation process and the consistency of the output products. At the same time, the increasing and urgent inspection needs require enterprises to implement product inspections quickly and accurately. [0003] In recent years, with the improvement of computer...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G06T17/30
CPCG06T17/30G06F30/20
Inventor 谢鹏张旨光吴新元
Owner UR MATERIALS IND SHENZHEN CO LTD
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products