Dual channel pci data acquisition card and method

Abstract

The invention discloses a dual-channel PCI data acquisition card and a method. The dual-channel PCI data acquisition card includes a dual-channel A / D converter, FPGA, SDRAM and a PCI interface chip; it is characterized in that: the FPGA receives the output from the PC The AD acquisition start signal of the signal starts the dual-channel AD converter to collect data; the dual-channel A / D converter collects dual-channel analog signals at the same time, and converts the analog signal data into digital signal data; the FPGA includes a system control module, A / D Control module, SDRAM control module, PCI control module, the first double clock buffer, the second double clock buffer and the third double clock buffer; the system control module is composed of a state machine, and the system control module is controlled by the PC to generate A / D control module, the first dual clock buffer, the second dual clock buffer, the third dual clock buffer, SDRAM control module and the control signal of the PCI control module; the present invention realizes dual-channel data acquisition and uninterrupted continuous acquisition A / D data ensures the continuity of high-speed data acquisition.

Description

technical field [0001] The invention relates to data acquisition, in particular to a dual-channel PCI data acquisition card and method. Background technique [0002] In the field of testing, the signal frequency, power, harmonics, and spurious indicators at the IF output of the RF receiver are usually tested with a spectrum analyzer. However, the spectrum analyzer is large in size, expensive, and slow in testing speed. The test cost of the solution using the spectrum analyzer is very high. The use of PCI high-speed data acquisition card to test the spectrum characteristics of RF signals is a low-cost and high-efficiency test solution with fast test speed and low cost of PCI acquisition card. [0003] Usually, the high-speed data acquisition card is composed of AD converter, FPGA, SDRAM and PCI controller, and the AD converter, FPGA and SDRAM adopted are different according to different application occasions. In the field of RF testing, the output form of the intermediate f...

AI Technical Summary

Problems solved by technology

At present, the PCI high-speed data acquisition card in the domestic market is not aimed at the RF test field. For high-speed digital-analog hybrid circuits, the quality of the wiring level determines the size of the noise floor, and the insufficient number of ADC data bits leads to insufficient dynamic range of the test.

Therefore, the PCI data acquisition cards currently on the market cannot fully meet the test requirements of RF receivers

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