Test circuit, array substrate and display device
A technology for testing circuits and array substrates. It is applied in the field of display devices and testing circuits. It can solve problems such as jitter and image afterimages, and achieve the effects of avoiding polarization and accelerating dissipation.
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[0025] In order to make the above objects, features and advantages of the present invention more comprehensible, specific implementations of the present invention will be described in detail below in conjunction with the accompanying drawings.
[0026] In the following description, many specific details are set forth in order to fully understand the present invention, but the present invention can also be implemented in other ways than those described here, so the present invention is not limited by the specific embodiments disclosed below.
[0027] Such as figure 2 As shown, the embodiment of the present invention provides a test circuit 10 for testing a pixel array 20 including a plurality of data lines 22, including a first test bus DO, a second test bus DE and at least one first transistor T1; A test bus DO and a second test bus DE are respectively used to provide different test signals to different data lines in the plurality of data lines 22 . The first test bus DO and...
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