Single-particle irradiation experiment test system and method based on JTAG (joint test action group) interface

Abstract

The invention relates to a single-particle irradiation experiment test system and method based on a JTAG (joint test action group) interface. The test system comprises an upper computer and a test board, wherein the test board comprises an SRAM (static random access memory), a configuration PROM (programmable read-only memory), a control processing FPGA (field programmable gate array) and a tested FPGA, the control processing FPGA comprises a serial port communication module, a process control module, a tested FPGA configuration module, a JTAG read-back module and an SRAM read-write module, simple functions are loaded on the tested FPGA, the upper computer is in charge of flow process control and data processing, and the control processing FPGA is in charge of processing commands sent by the upper computer and carrying out work such as single-particle turning and single-particle function interruption detection. The system and the method have the advantages that the control processing FPGA is connected with the JTAG interface of the tested FPGA, the single-particle turning detection is realized through the JTAG interface, the system is more stable, the result is more reliable, in addition, the device model of the tested FPGA can be automatically recognized, and the effect of self adaptation to the single-particle irradiation experiment test of the tested FPGAs in different models is achieved.

Description

technical field [0001] The invention relates to a single-particle radiation test system and method, in particular to a single-particle radiation test system and method based on a JTAG interface, which belongs to the field of FPGA test and radiation test. Background technique [0002] Field Programmable Gate Array (FPGA) devices have the advantages of high flexibility, low cost, and short cycle time, which greatly shortens the development and production cycle and minimizes risks. It is especially suitable for aerospace engineering to provide high reliability, multiple varieties, and The characteristic requirements of small batches are widely used in aerospace engineering at home and abroad. However, the single event effect in the space environment has a great impact on SRAM FPGA devices, which can easily lead to malfunctions in satellite communication or control, and cause huge losses to the military and the economy. Therefore, before FPGA is applied in space system, it is n...

AI Technical Summary

Problems solved by technology

[0003] At present, the existing single event irradiation test system usually uses CPU or embedded chip as the control system, and uses the SelectMAP port to configure and read back the FPGA under test. This method is complex and not stable enough, and can only be used for a single The device is subjected to single-event irradiation test, which is not universal

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