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Improved transmission/reflection method for measuring electromagnetic parameters of material

An electromagnetic parameter and reflection method technology, which is applied in the direction of measuring resistance/reactance/impedance, measuring electrical variables, measuring devices, etc., can solve problems such as parameter measurement errors, and achieve the effect of avoiding multi-valued problems

Inactive Publication Date: 2015-02-04
SHANGHAI INST OF MEASUREMENT & TESTING TECH
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Problems solved by technology

[0006] The purpose of the present invention is to provide an improved transmission / reflection method for measuring electromagnetic parameters of materials, so as to solve the existing transmission / reflection method when measuring electromagnetic parameters, there is a certain error in parameter measurement and the multi-value problem that exists when solving

Method used

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  • Improved transmission/reflection method for measuring electromagnetic parameters of material
  • Improved transmission/reflection method for measuring electromagnetic parameters of material
  • Improved transmission/reflection method for measuring electromagnetic parameters of material

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Embodiment Construction

[0033] In order to better illustrate the present invention, a preferred embodiment is hereby combined with the attached Figure 1 to Figure 4 The present invention is described in detail, specifically as follows:

[0034] Such as figure 2 Shown, the transmission / reflection method of the improved measurement material electromagnetic parameter provided by the present invention comprises the following steps:

[0035] S1: Establish a transmission / reflection method two-port network measurement model.

[0036] When the coaxial line is used as the test fixture, the measurement model is as image 3 As shown, it includes a test sample, a test fixture, the test sample is placed in the test fixture, the length of the test sample is d, the radius of the central hole of the test sample is b (that is, the inner conductor radius of the coaxial line is b), The length of the test fixture is L, and the distance between one end of the test sample and the corresponding end port of the test fi...

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Abstract

The invention provides an improved transmission / reflection method for measuring electromagnetic parameters of a material. The method comprises the steps of: performing phase compensation on parameters S11' and S21' measured by a vector network analyzer so as to obtain more precise parameters S11 and S21; calculating to obtain values of complex permeability mur and complex dielectric constant epsilonr of a testing sample by utilizing the transmission / reflection method and by virtue of the obtained and compensated measuring parameters S11 and S21. Meanwhile, the problem of fuzzy points is met in the method of measuring the electromagnetic parameters based on the transmission / reflection method, the fuzzy points of a reflection coefficient and a transmission coefficient are resolved by adopting a method of judging an analogue value by data, a reflection coefficient is ensured to be obtained, and a multi-value problem is avoided.

Description

technical field [0001] The invention relates to the technical field of measuring electromagnetic parameters of materials, in particular to an improved transmission and reflection method for measuring electromagnetic parameters of materials. Background technique [0002] With the development of electronic components in the direction of miniaturization, integration, and high frequency, more and more new materials such as electrolyte materials and thin films need to be characterized by microwave electromagnetic parameters such as dielectric constant, magnetic permeability, and loss tangent. performance. Relative complex permittivity (ε r =ε' r -jε″ r ) and relative complex permeability (μ r =μ' r -jμ″ r ) measurement is often very important for reasonable material selection and device design. If there is a large error in the measurement of electromagnetic parameters, there will be a big difference between the design and simulation results and the actual results. [0003]...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R27/26G01R33/12
Inventor 蔡青来磊滕玉龙黄玉珲沈菊霞
Owner SHANGHAI INST OF MEASUREMENT & TESTING TECH
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