Quantitative evaluation method for on-orbit single event upset protection of sram type fpga

Abstract

The invention provides a quantitative evaluation method for SRAM-type FPGA on-orbit single-event flipping protection, including: calculating the device-level single-event flipping rate of SRAM-type FPGA; One or any of them to reduce the probability of single-event flipping, and then calculate the single-event flipping rate at the stand-alone level; use any of timing refresh, readback refresh, timing reload, readback reload, and watchdog One or any number of protection methods can reduce the impact of single event reversal and reduce the harm caused by single event reversal, and then calculate the function impact degree and task success degree of single event reversal at the stand-alone level. The invention solves the problem of quantitative calculation of single-machine single-particle turnover rate after taking various software and hardware protection measures for spacecraft products containing SRAM-type FPGA, and quantifies the degree of impact on single-machine functions and the impact of single-machine task interruption after turning over Assessment questions.

Description

technical field [0001] The invention relates to the technical field of spacecraft, in particular to a quantitative evaluation method for SRAM-type FPGA on-orbit single-event upset protection. Background technique [0002] With the development of spacecraft in the direction of long life and high reliability, galactic cosmic rays, solar cosmic rays, and high-energy charged particles in the Earth's radiation belt, especially the single-particle flips caused by heavy ions, have become a must for the reliable operation of spacecraft in orbit. A key factor to focus on. [0003] As spacecraft design functions become more complex, various Field Programmable Gate Array (FPGA) chips are widely used, which solves the shortcomings of custom circuits and overcomes the shortcomings of the limited number of gate circuits of original programmable devices, and is suitable for triggering rich structure. Among them, the SRAM type FPGA is more widely used because it can be used repeatedly, bu...

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Problems solved by technology

[0010] For the defects in the prior art, the purpose of the present invention is to solve the problem of quantitative calculation of single-machine single-particle turnover rate after taking various software and hardware protection measures for spacecraft products containing SRAM type FPGA, and the single-machine function after turning over. Quantitative evaluation of the degree of impact and the degree of impact caused by interruption of single-machine tasks

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