SRAM type FPGA on-orbit single-particle turning protection quantitative evaluation method

Abstract

The invention provides an SRAM (Short-Range Attack Missile) type FPGA (Field Programmable Gate Array) on-orbit single-particle turning protection quantitative evaluation method, which comprises the following steps of: calculating the device level single-particle turning rate of a SRAM type FPGA; adopting any one or various measures from resource derating, triplication redundancy and intermittent booting and shutdown for reducing the single-particle turning occurring probability, and further calculating the one-machine level single-particle turning rate; adopting any one or various protection methods from regular refreshing, read-back refreshing, regular reloading, read-back reloading and watchdog for reducing the influence caused by the single-particle turning and reducing the harm caused by the single-particle turning; and further obtaining the function influence degree and the task success influence degree of the one-machine level single-particle turning through calculation. The SRAM type FPGA on-orbit single-particle turning protection quantitative evaluation method solves the problem of quantitative calculation of the one-machine single-particle turning rate after the adoption of various software and hardware protection measures of an aircraft product including the SRAM type FPGA and the problem of quantitative evaluation of the one-machine task interruption influence degree and the one-machine function influence degree after the turning.

Description

technical field [0001] The invention relates to the technical field of spacecraft, in particular to a quantitative evaluation method for SRAM-type FPGA on-orbit single-event upset protection. Background technique [0002] With the development of spacecraft in the direction of long life and high reliability, galactic cosmic rays, solar cosmic rays, and high-energy charged particles in the Earth's radiation belt, especially the single-particle flips caused by heavy ions, have become a must for the reliable operation of spacecraft in orbit. A key factor to focus on. [0003] As spacecraft design functions become more complex, various Field Programmable Gate Array (FPGA) chips are widely used, which solves the shortcomings of custom circuits and overcomes the shortcomings of the limited number of gate circuits of original programmable devices, and is suitable for triggering rich structure. Among them, the SRAM type FPGA is more widely used because it can be used repeatedly, bu...

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Problems solved by technology

[0010] For the defects in the prior art, the purpose of the present invention is to solve the problem of quantitative calculation of single-machine single-particle turnover rate after taking various software and hardware protection measures for spacecraft products containing SRAM type FPGA, and the single-machine function after turning over. Quantitative evaluation of the degree of impact and the degree of impact caused by interruption of single-machine tasks

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