Surface light scattering measuring device

A technology of light scattering measurement and laser, which is applied in the direction of scattering characteristic measurement, etc., to achieve the effect of simple device structure, light applicability and easy operation

Inactive Publication Date: 2015-01-21
SUZHOU PTC OPTICAL INSTR
View PDF5 Cites 5 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Therefore measuring surface light scattering becomes a problem to be solved

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Surface light scattering measuring device

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0013] In order to deepen the understanding of the present invention, the present invention will be further described below in conjunction with the embodiments and accompanying drawings. The embodiments are only used to explain the present invention and do not constitute a limitation to the protection scope of the present invention.

[0014] figure 1 An embodiment of a surface light scattering measurement device of the present invention is shown, including a laser 1, a chopper 2, an attenuator 3, an integrating sphere 4, a lock-in amplifier 5, a receiver 6 and a digital voltmeter 7, the The light emitted by the laser 1 passes through the chopper 2, then enters the integrating sphere 4 through the attenuator 3 and irradiates the surface of the sample 8, and is received by the receiver 6 after being reflected by the sample 8. The integrating sphere 4 is provided with a detector and A preamplifier 9, the chopper 2 is connected to a lock-in amplifier 5, the lock-in amplifier 5 is ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention discloses a surface light scattering measuring device comprises a laser, a chopper, an attenuator, an integrating sphere, a phase locking amplifier, a receiver and a digital voltmeter, wherein the light emitted by the laser passes the chopper, then passes the attenuator, enters the integrating sphere and illuminates the surface of a sample; the light is reflected by the sample and received by the receiver; a detector and a pre-amplifier are arranged on the integrating sphere; the chopper is connected with the phase locking amplifier; the phase locking amplifier is connected with the detector and the pre-amplifier; the phase locking amplifier is further connected with the digital voltmeter. According to the surface light scattering measuring device, as the laser light source is adopted, the surface light scattering measuring device is especially useful and the procession is high; the laser light source is particularly suitable for providing high-quality monochromatic source, the surface light scattering can be measured quickly and effectively; surface light scattering measuring device has the advantages that the structure is simple, the measurement result is accurate, the operation is simple and the applicability is high.

Description

[0001] technical field [0002] The invention relates to a surface measurement device, in particular to a surface light scattering measurement device. Background technique [0003] The inhomogeneous clumps in the material make the light entering the material deviate from the incident direction and scatter in all directions. This phenomenon is called light scattering, and the light that disperses in all directions is called scattered light. Like the absorption of light, the scattering of light also reduces the intensity of the light passing through the material. Due to the existence of particles of other substances in the medium, or due to the inhomogeneity of the density of the medium itself (that is, density fluctuations), the phenomenon of light scattering is widely used in various scientific and technological departments. Through the measurement of scattered light, the concentration, size, shape and orientation of scattered particles can be known, and it has been applied...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
IPC IPC(8): G01N21/47
Inventor 尚修鑫
Owner SUZHOU PTC OPTICAL INSTR
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap