A method and system for concurrent testing of embedded modules

Abstract

The invention relates to the field of software testing, in particular to a method and system for concurrent testing of embedded modules. The method includes: S101, setting module information for more than two modules to be tested, and forming the set to-be-tested modules into a to-be-tested list; S102, extracting each to-be-tested module from the to-be-tested list and placing it in a separate In the thread, and according to the preset initialization content, each module to be tested and the thread are initialized; S103, after step S102 initialization, start the thread concurrently to execute the module test function and return the module test result; S104, Count the test results of the modules and judge whether there is an error in the test results of the modules; S105. If an error occurs in the test results of the modules, store the test results of the modules in a preset error log file. Through this method, it can be realized whether the test module can operate normally under the condition of high load of the system, so as to achieve the purpose of testing the module.

Description

technical field [0001] The invention relates to the field of software testing, in particular to a method and system for concurrent testing of embedded modules. Background technique [0002] Due to the large number of embedded product modules and the high degree of integration with the system, the modules may have conflicts in the use of system resources (such as serial ports, USB, etc.). resources and cause it to fail to function properly. [0003] When multiple modules run at the same time, the load on the system is relatively large, so other modules or the system may run abnormally during concurrent execution. In the traditional embedded module concurrency test, by writing a concurrency test script for each module and embedding the script into the concurrent process, once a new module or a change in the module needs to modify the concurrency strategy, the concurrent process needs to be modified, and at the same time The requirements for flexible configuration cannot be r...

AI Technical Summary

Problems solved by technology

[0002] Due to the large number of embedded product modules and the high degree of integration with the system, the modules may have conflicts in the use of system resources (such as serial ports, USB, etc.). resources and cause it to fail to function properly

[0003] When multiple modules run at the same time, the load on the system is heavy, so other modules or the system may run abnormally during concurrent execution

In the traditional embedded module concurrency test, by writing a concurrency test script for each module and embedding the script into the concurrent process, once a new module or a change in the module needs to modify the concurrency strategy, the concurrent process needs to be modified, and at the same time It is also impossible to achieve flexible configuration requirements for concurrent modules

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