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Backscatter cross section measurement method based on cylinder scanning three-dimensional near-field imaging

A measurement method, backscattering technology, applied in the direction of radio wave reflection/re-radiation, measurement device, radio wave measurement system, etc., to achieve accurate measurement value and simple measurement process

Active Publication Date: 2014-12-17
INST OF ELECTRONICS CHINESE ACAD OF SCI
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Problems solved by technology

[0004] However, the current test methods are all analyzed and discussed for the RCS measurement principle of single-station circular track near-field imaging.

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  • Backscatter cross section measurement method based on cylinder scanning three-dimensional near-field imaging
  • Backscatter cross section measurement method based on cylinder scanning three-dimensional near-field imaging
  • Backscatter cross section measurement method based on cylinder scanning three-dimensional near-field imaging

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Embodiment Construction

[0020] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be described in further detail below in conjunction with specific embodiments and with reference to the accompanying drawings. It should be noted that, in the drawings or descriptions of the specification, similar or identical parts all use the same figure numbers. Implementations not shown or described in the accompanying drawings are forms known to those of ordinary skill in the art. Additionally, while illustrations of parameters including particular values ​​may be provided herein, it should be understood that the parameters need not be exactly equal to the corresponding values, but rather may approximate the corresponding values ​​within acceptable error margins or design constraints. The directional terms mentioned in the embodiments, such as "upper", "lower", "front", "rear", "left", "right", etc., are only referring to the directions of the...

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Abstract

The invention provides a backscatter cross section measurement method based on the cylinder scanning three-dimensional near-field imaging. The method includes in a determined frequency range, allowing a transceiving antenna to perform scanning test along the set cylinder surface in the certain step frequency, and acquiring the scattered echo data before and after the placement of a target to be measured; calculating the actual scattered echo data of the target to be measured after background cancellation according to the scattered echo data before and after the placement of the target to be measured; performing three-dimensional imaging by means of the actual scattered echo data of the target to be measured after background cancellation, and acquiring a target three-dimensional radar scattering image psi e (x, y, z); acquiring a calibration body three-dimensional radar scattering image psi ecal (x, y, z); calculating a target radar scattering cross section RCS value (img file = 'DDA0000561332250000011.TIF' wi = '240' he = '77' / ) of the target to be measured. By the aid of the method, the target three-dimensional radar scattering image can be acquired, the target RCS value in a certain solid angle domain can be also acquired, and the target electromagnetic scattering characteristics can be acquired more clearly, more specifically and completely.

Description

technical field [0001] The invention relates to the technical field of radar in the electronics industry, in particular to a backscattering section measurement method based on cylindrical scanning three-dimensional near-field imaging. Background technique [0002] Scattering cross-section testing techniques include external field testing, compact field testing, and near-field testing. For the electrical large size with higher frequency, the required field test site is very large. In addition, the field test is easily affected by external electromagnetic interference, climate and other factors. The operation and maintenance costs of the equipment in the compact field are high, the error analysis is very complicated, and it is difficult to correct, and the space utilization rate is not high. [0003] In the late 1970s, frequency-domain near-field testing technology began to shift from radiation problems to scattering problems. The measurement principle is usually based on th...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01S13/89G01S7/41
CPCG01S7/41G01S13/89
Inventor 吕晓德邢曙光丁赤飚林宽
Owner INST OF ELECTRONICS CHINESE ACAD OF SCI
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