Embedded intelligent milling duplication eliminating balance measuring system based on OMAP

Abstract

The invention provides an embedded intelligent milling duplication eliminating balance measuring system based on an OMAP, and belongs to the technical field of detection devices. The system is composed of a signal conditioning circuit, an A / D conversion system and an OMAP embedded system. The signal conditioning circuit is composed of a left magnetoelectric sensor, a right magnetoelectric sensor, a signal conditioning circuit, a photoelectric sensor, a mean value extracting circuit, a pulse shaping circuit and a phase locking doubling circuit. Mechanical vibration signals are converted into voltage signals through the left magnetoelectric sensor and the right magnetoelectric sensor, the photoelectric sensor acquires phase reference signals, and the A / D conversion system is used for A / D conversion. Digital signals generated after A / D conversion are sent to an ARM in the OMAP system, full period sampling is conducted under the effect of clock pulse signals, sampled periodic signals are sent to a DSP unit through an SCR / EDMA, the amplitude and phase information of the amount of unbalance is extracted through calibration and resolving, and meanwhile the speed of a rotating spindle is measured according to shaped pulse signals.

Description

technical field [0001] The invention belongs to the technical field of detection equipment, and relates to a device for weight removal and balance measurement in milling processing. Background technique [0002] Most of the dynamic balance test systems work in places with complex environments, and there are various strong interference sources around them that directly or indirectly affect the work of the test system, so the reliability of the dynamic balance test system is one of the main contents of the design system. [0003] At present, the test system of the dynamic balancing machine is mainly composed of microcontrollers and peripheral components. It has many disadvantages such as low integration, poor stability, low measurement accuracy, weak anti-interference ability, and slow operation speed, and it is easy to cause crashes. Contents of the invention [0004] The technical problem to be solved by the present invention is to provide an OMAP-based embedded intelligen...

AI Technical Summary

Problems solved by technology

[0003] At present, the test system of the dynamic balancing machine is mainly composed of microcontrollers and peripheral components. It has many disadvantages such as low integration, poor stability, low measurement accuracy, weak anti-interference ability, and slow operation speed, and it is easy to cause crashes.

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