Testing method and device
A test method and test device technology, applied in the field of data processing, can solve problems such as unproposed solutions and low test efficiency, and achieve the effects of solving low test efficiency, shortening test time, and reducing quality requirements
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[0024] It should be noted that, in the case of no conflict, the embodiments in the present application and the features in the embodiments can be combined with each other. The present invention will be described in detail below with reference to the accompanying drawings and examples.
[0025] figure 1 is a schematic structural diagram of a test device according to an embodiment of the present invention. Such as figure 1 As shown, the test device may include: a first receiving module 10, configured to receive a communication test request for testing the device under test, wherein the communication test request includes test data; a first reading module 30, configured to read the The communication protocol corresponding to the communication test request; the first processing module 50 is used to frame the test data based on the communication protocol to obtain the communication data; the second processing module 70 is used to send the communication data to the device under te...
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