A general metering test interface adapter

Abstract

The invention relates to a universal metering test interface adapter. The universal metering test interface adapter comprises an adapting cable, a uniformization test interface, a switch matrix, standard test interfaces and a power source. An input end of the uniformization test interface is connected with an external tested device through the adapting cable, and an output end of the same is connected with an input end of the switch matrix and used for accessing tested signals into the adapter. An input end of the switch matrix is connected with the uniformization test interface, and an output end of the switch matrix is connected with the standard test interfaces and used for being respectively connected with the corresponding standard test interfaces according to signal types of the tested signals. The standard test interfaces are connected with an external calibrating device and used for accessing the tested signals into the external calibrating device. The power source is connected with the switch matrix and used for supplying power for the switch matrix. The universal metering test interface adapter has higher universality and convenience in operation, signal connection can be realized only by changing the adapting cable for different non-standard test interfaces, and needs of manufacturing other test modules and opening a machine case to replace the modules are omitted.

Description

technical field [0001] The invention relates to an interface adapter for measuring medium and low frequency signals, in particular to a universal measurement and test interface adapter. Background technique [0002] In the metrology work, we often encounter the problem that the standard test interface of the verification device does not match the special interface of the equipment under test. Hundreds or even thousands of devices under test have the same signal type but the special interface forms are very different. This requires test interface adapters to establish connections between standard test interfaces and non-standard dedicated interfaces. And the cost of making an interface adapter for each device under test is too high, and it is necessary to design a general test interface adapter with a simple structure and easy operation to solve the matching problem of a large number of special interfaces of the devices under test. [0003] The Chinese invention patent whos...

AI Technical Summary

Problems solved by technology

[0004] The technical problem to be solved by the present invention is to provide a universal metering test interface adapter that can solve the problem of inconsistency in the interfaces of different tested devices and is oriented to medium and low frequency signals.

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