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Electric transport property measuring device and measuring method

A measuring device and electric transportation technology, which is applied in the direction of measuring devices, measuring electrical variables, and components of electrical measuring instruments, etc., can solve the problems of prolonging the experimental period and time-consuming and laborious operation process, so as to improve the experimental efficiency, reduce the impact, Enhanced stability and reliability effects

Active Publication Date: 2014-07-23
SHANGHAI JIAO TONG UNIV
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  • Abstract
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  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The traditional four-probe device includes four probes and a sample stage, and the sample stage is fixed. When using this device to measure anisotropic electrical transport properties, it is necessary to prepare multiple materials, and then place the probes It is arranged along different crystal orientations, so as to measure the electrical transport characteristics of the material on different crystal orientations; on the other hand, because each probe is controlled by its own adjustment component, when adjusting the position of each probe on the crystal It is necessary to adjust each probe in turn, which makes the actual operation process more time-consuming and laborious, and in order to eliminate the inhomogeneity of material growth, statistical analysis is required, resulting in the extension of the experimental cycle

Method used

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Embodiment Construction

[0027] The embodiments of the present invention are described in detail below in conjunction with the accompanying drawings. This embodiment is implemented on the premise of the technical solution of the present invention, and detailed implementation methods and specific operating procedures are provided, but the scope of protection of the present invention is not limited to the following Example.

[0028] In a preferred embodiment of the present invention, as figure 1 and 2 As shown, a device for measuring electrical transport characteristics includes: a platform body 100 , a four-probe lifting system 300 and a sample stage rotation system 400 . The sample 200 to be tested is set on the sample stage rotation system 400 .

[0029] The platform main body 100 includes an upper platform 14, a lower platform 15 and a plurality of connecting wings 12, the two ends of each connecting wing 12 are respectively connected to the upper platform 14 and the lower platform 15, and these co...

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Abstract

The invention discloses an electric transport property measuring device. The electric transport property measuring device comprises a platform body, a four-probe lifting system and a sample stage rotating system. The platform body comprises an upper platform, a lower platform and lifting channels. The four-probe lifting system comprises probe assemblies and a stepped motor. The sample stage rotating system comprises a transmission sample stage, a rotary shaft and a driving part. The invention further discloses an electric transport property measuring method. Anisotropic electric transport properties of crystalline materials are measured through multiple steps. The electric transport property measuring device and measuring method solve the problem that the anisotropic electric transport properties can not be measured conveniently through a traditional four-point probe transport testing device, greatly simplify operation process and improve experiment efficiency.

Description

technical field [0001] The invention relates to a measuring device and a measuring method, in particular to a measuring device and a measuring method for electrical transport characteristics. Background technique [0002] The structure and physical properties of many crystalline materials have varying degrees of anisotropy, which has become the focus of academic basic research and material application development. Anisotropic electrical transport characteristics are an important characteristic of crystalline materials. The traditional four-probe device includes four probes and a sample stage, and the sample stage is fixed. When using this device to measure anisotropic electrical transport properties, it is necessary to prepare multiple materials, and then place the probes It is arranged along different crystal orientations, so as to measure the electrical transport characteristics of the material on different crystal orientations; on the other hand, because each probe is con...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/00G01R1/073
Inventor 刘灿华张马淋贾金锋
Owner SHANGHAI JIAO TONG UNIV
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