Capacitive probe device with function of reducing electric field distortion

Abstract

The invention provides a capacitive probe device with the function of reducing electric field distortion. The capacitive probe device comprises a cylindrical vacuum cavity structure, an insulating ceramic barrel fixed to the inner side of the vacuum cavity structure, an annular electron beam induction ring which is made of a metal conducting material and is fixed to the middle of the inner side of the insulating ceramic barrel, annular electric field improving rings which are made of a metal conducting material, fixed to the upper portion and the lower portion of the inner side of the insulating ceramic barrel, insulated from the electron beam induction ring, and equipotential with the vacuum cavity structure, and a lead adapting assembly which is used for leading an induction signal of the electron beam induction ring out of the vacuum cavity structure. In the capacitive probe device, the electric field improving rings which are insulated from the electron beam induction ring are arranged on both sides of the electron beam induction ring, thereby greatly reducing the electric field distortion on the edges of both sides of the electron beam induction ring, and making an electron field more uniform.

Description

technical field [0001] The invention relates to the technical field of vacuum electronics, and relates to a capacitive probe structure of a system for measuring electron injection velocity, in particular to a capacitive probe device with the function of reducing electric field distortion. Background technique [0002] Electrovacuum devices are a type of active electronic devices that use electron beams to interact with high-frequency electromagnetic fields to achieve microwave power amplification and conversion functions in vacuum or gaseous media. Nowadays, electric vacuum devices are widely used in the fields of radar, electronic countermeasures, guidance and satellite communication. With the development of electric vacuum device technology, various electronic injection measurement systems have emerged. [0003] figure 1 It is a structural schematic diagram of a capacitive probe device and related components in the prior art. Such as figure 1 As shown, the front end of...

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Problems solved by technology

[0007] (1) Since the electronic injection induction ring and the insulating ceramic have a certain thickness, there is a large non-radial electric field at the front and rear edges of the induction ring, which increases the distortion of the voltage waveform measured on the electronic injection induction ring, making the detection The results and subsequent calculations all bring large errors;

[0008] (2) Since the lead wires of the electron injection induction loop are drawn separately from the rear side edge, this aggravates the electric field distortion, and at the same time, the lead wires are easily bombarded by stray electrons, which reduces the accuracy of probe detection;

[0009] (3) The vacuum insulated feed head located on the vacuum chamber is an ordinary ceramic electrode, and its outer lead connector is exposed in the space, which is easily interfered by various electromagnetic waves in the space, and even the signal is drowned

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