Device for testing communication error rate and sensitivity of light module
A test device and bit error rate technology, which is applied in the field of optical communication, can solve problems affecting test accuracy and test efficiency, complex functions, and expensive prices, so as to facilitate mass production test control, improve product quality and performance, and reduce effect of demand
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[0059] Such as figure 1 As shown, the test device for optical module communication bit error rate and sensitivity of the present invention is an electrical signal drive distribution and selection circuit 1, an error detection circuit 2, an optical transceiver module circuit 3, an optical power detection and attenuation control circuit 4, and an optical signal drive distribution And selection circuit 5 and control circuit 6.
[0060]Wherein, the electrical signal driving distribution and selection circuit 1 can divide one channel into multiple channels, and can select the channel to output an electrical signal, and the electrical signal driving distribution and selection circuit 1 is connected to the optical transceiver module 100 to be tested (such as image 3 shown).
[0061] The code error detection circuit 2 can generate and output a code error electrical signal, and can also receive and detect a code error electrical signal. The code error detection circuit 2 is connected...
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