Device and method for malfunction treatment of refrigerator probes

Abstract

The invention relates to a device and method for malfunction treatment of refrigerator probes. The environmental temperature is defaulted to be 25 DEG C when an environmental temperature probe is malfunctioned; when the environmental temperature probe is in good condition but temperature probes in one chamber or more chambers are malfunctioned, a single-chip processor operates a compressor and a relevant electromagnetic valve of each chamber by reasonable on-off time according to environment temperature levels to control the temperature of the chambers within a reasonable range. The method has the advantages that even if one or more probes are malfunctioned, the temperature of a refrigerator can be controlled within a favorable temperature range to enable articles stored in the refrigerator to keep fresh in a certain period.

Description

technical field [0001] The invention relates to the field of refrigerator control, in particular to a method and device for treating failure of a refrigerator probe. Background technique [0002] figure 1 It is the detection circuit of the conventional refrigerator probe, and the resistance signal of the probe is converted into a voltage signal by connecting one or more resistors in series, and input to the A / D port of the single-chip microcomputer. The temperature probe is a device used to collect the actual temperature in the refrigerator. Generally, a room should have at least one temperature probe, which is one of the most important devices in the normal operation of the refrigerator. [0003] However, the following reasons may lead to the failure of the probe: 1. The sensor connecting wire is prone to cracks under low temperature for a long time in a cold and hot cycle environment. If cracks occur, the moisture will penetrate into the temperature sensing element along ...

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Problems solved by technology

[0003] However, the following reasons may lead to the failure of the probe: 1. The sensor connection line is prone to cracks under low temperature for a long time in a cold and hot cycle environment. If cracks occur, moisture will penetrate into the temperature sensing element along the wire and cause the parameter change of the temperature sensing device of the sensor; 2. 1. The solder joint of the probe temperature sensing element is broken and deformed; 3. The connection line of the sensor temperature sensing device is disconnected in the middle, or the contact is poor; 4. The connector is easy to age under low temperature for a long time in the cold and heat cycle environment, resulting in poor contact

Once one or more compartment temperature probes fail, the entire refrigerator may not operate normally or operate incorrectly, so that the items stored in the refrigerator will quickly deteriorate, causing losses to users before the refrigerator is repaired

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