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USB signal testing fixture

A signal test and fixture technology, applied in error detection/correction, instrumentation, electrical digital data processing, etc., can solve problems such as loose connection between the connection line and the USB hub interface, performance degradation of the connection line, and confusion on the test table, etc., to achieve Realize the effect of testing cost, eliminating mechanical damage and reducing external interference

Inactive Publication Date: 2014-03-26
HONG FU JIN PRECISION IND (SHENZHEN) CO LTD +1
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The method currently adopted is to use five independent USB hubs (HUBs) physically connected in series, and then build a 6-level transmission system for testing through an auxiliary test fixture. Because this method is manually connected, there are irreversible errors, which will cause The connection between the cable and the interface of the USB hub is not tight
However, after the connecting wire has been plugged and unplugged many times, the interface will be damaged and the performance of the connecting wire will be degraded. Moreover, since each USB hub needs to be connected to a separate external 5V power supply, multiple sockets need to be configured, resulting in a very confusing test table.

Method used

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Embodiment Construction

[0016] Please refer to figure 1 , the preferred embodiment of the test fixture 600 of the present invention includes a circuit board, and the circuit board is provided with an upward port 700, a downward port 706, first to fifth USB hub chips (USB HUB IC), and the corresponding numbers are sequentially 601-605, the first to fifth USB HUB ICs 601-605 are sequentially connected in series. Each USB HUB IC includes three groups of transmission pins for transmitting USB signals, the first group of USB transmission pins of the first USB HUB IC 601 is connected to the upward port 700, the second group of USB transmission pins of the first USB HUB IC 601 The pins are connected to the first group of USB transmission pins of the second USB HUB IC 602 , and the third USB transmission pins of the first USB HUB IC 601 are connected to a USB interface 701 . The second group of USB transmission pins of the second USB HUB IC 602 is connected to the first group of USB transmission pins of the...

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Abstract

The invention discloses a USB signal testing fixture. The USB signal testing fixture comprises a circuit board, wherein the circuit board is provided with a port facing upwards, a plurality of USB concentrator chips, a port facing downwards, a power supply port and a clock generator, wherein the port facing upwards is used for receiving an input signal, the USB concentrator chips are sequentially connected in series and are used for converting the input signal into a plurality of output signals which are the same as the input signal, the port facing downwards outputs the signals transmitted by the USB concentrator chips, the power supply port is used for providing equipment working voltage, and the clock generator is used for making a plurality of ICs work in the same timing sequence. Due to the fact that the integration of USB concentrators is achieved, USB signal testing fixture can conveniently and accurately measure the quality of USB signals after the USB signals are transmitted in a multi-stage mode.

Description

technical field [0001] The invention relates to a test fixture for testing USB signals. Background technique [0002] In the USB Signal Integrity (USB Signal Integrity) test project, according to the requirements, the test needs to verify the quality of the signal after the 6-level transmission. The method currently adopted is to use five independent USB hubs (HUBs) physically connected in series, and then build a 6-level transmission system for testing through an auxiliary test fixture. Because this method is manually connected, there are irreversible errors, which will cause The connection cable is not tightly connected to the interface of the USB hub. After repeated plugging and unplugging of the connecting wire, the interface will be damaged and the performance of the connecting wire will be degraded. Moreover, since each USB hub needs to be connected to a separate external 5V power supply, multiple sockets need to be configured, resulting in a very confusing test table...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F11/267
CPCG06F13/4027
Inventor 陈杰
Owner HONG FU JIN PRECISION IND (SHENZHEN) CO LTD
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