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Device for improving the detection sensitivity of laser-induced plasma spectrum

A plasma spectroscopy and laser-induced technology, which is applied in the field of devices for the detection sensitivity of plasma spectroscopy to achieve the effects of enhanced emission intensity, high ionization efficiency and enhanced spectral radiation intensity

Active Publication Date: 2014-02-26
ANHUI INST OF OPTICS & FINE MECHANICS - CHINESE ACAD OF SCI
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Problems solved by technology

[0004] The purpose of the present invention is to provide a device for improving the detection sensitivity of laser-induced plasma spectrum, so as to solve the problems faced by the existing LIBS analysis technology in improving the detection sensitivity of signals

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  • Device for improving the detection sensitivity of laser-induced plasma spectrum
  • Device for improving the detection sensitivity of laser-induced plasma spectrum
  • Device for improving the detection sensitivity of laser-induced plasma spectrum

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Embodiment Construction

[0020] Such as figure 1 shown. A device for improving the detection sensitivity of laser-induced plasma spectra, comprising a hollow device housing, an opening is opened in the center of the bottom of the device housing, and a transparent fused silica material installed in the central opening of the bottom of the device housing is arranged in the device housing A hemispherical shell 4, a through hole is provided on the top of the hemispherical shell, a laser focusing device 1 is installed in the center of the top of the device shell, and the laser focusing device 1 is located directly above the through hole on the top of the hemispherical shell 4, next to the laser focusing device 1 The top of the device housing is equipped with an ambient gas inlet port 8 communicating with the inside and outside of the device housing, and a plurality of optical fiber interfaces 10 are installed on the top of the device housing around the laser focusing device 1, and the plurality of optical ...

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Abstract

The invention discloses a device for improving the detection sensitivity of laser-induced plasma spectrum, aiming at difficulties of LIBS analysis technology in improving the detection sensitivity and reducing effectively the detection limit. According to the theory of the device, based on the physical mechanism of laser-induced plasma and the spatial-temporal evolution process of the plasma, the laser-induced plasma intensity is enhanced and background radiation is reduced by changing the outer space structure and the environment of the laser-induced plasma; and by utilization of multichannel spectral signal collection in different angles, coupling transmission of spectral signals to a spectrograph is achieved by utilization of multi-core fiber, the maximum collection and utilization of spectral signals can be achieved, and space distribution characteristics of the laser-induced plasma can be obtained to improve the detection sensitivity of elements to be detected. The device is compact in structure and can be used conveniently and flexibly. The device is suitable for element detection of all solid materials using the LIBS technology as an analysis means, and can be used in various work environments indoor and outdoor. The device is especially suitable for on-site element detection.

Description

technical field [0001] The invention relates to the field of laser spectrum analysis devices, in particular to a device for improving the detection sensitivity of laser-induced plasma spectra. Background technique [0002] Laser-Induced Breakdown Spectroscopy (LIBS) is a technology for rapid analysis of material elements. It uses a beam of short-pulse laser to focus through a lens to ablate the surface of the detection material to generate a micro-plasma. The spectral signals emitted by these plasmas and their intensities are used to determine the elements present and their concentrations. This analysis technique has many outstanding advantages: no sample preparation, real-time fast, in situ, multi-element simultaneous detection, and various forms of detected objects, etc., with broad application prospects. However, there is a problem in the analysis of trace elements using LIBS, which is the low sensitivity of the measurement, especially for the measurement of heavy metal ...

Claims

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Application Information

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IPC IPC(8): G01N21/63
Inventor 马明俊赵南京肖雪刘文清刘建国方丽王寅胡丽孟德硕余洋张大海王久悦
Owner ANHUI INST OF OPTICS & FINE MECHANICS - CHINESE ACAD OF SCI
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