Device and corresponding method for measuring optical rotation of transparent film with periodic chiral structure
A technology of chiral structure and transparent thin film, applied in the direction of polarization influence characteristics, etc., can solve the problems of small structure size, difficulty in measuring optical rotation angle, etc., and achieve the effect of simple measurement process and accurate measurement results
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Embodiment 1
[0024] A device for measuring the optical rotation of a transparent thin film with a periodic chiral structure proposed by the present invention, its composition structure is as follows figure 1 As shown, it includes a light source 1 for measurement, a polarizer 2, a diaphragm 3, an analyzer 7 and a fiber optic spectrometer 8, and the polarizer 2, diaphragm 3 and analyzer 7 are sequentially arranged on the light source 1 for measurement to emit On the light propagation path of the light beam, the polarizer 2 is connected with a stepping motor 10 for driving the polarizer 2 to rotate, and a position-adjustable sample stage is arranged between the aperture 3 and the analyzer 7, through which the The light beam of the aperture 3 is vertically irradiated on the periodic chiral structure transparent film fixed on the sample stage, the probe of the fiber optic spectrometer 8 detects the light intensity of the beam passing through the analyzer 7, and the output end of the fiber optic ...
Embodiment 2
[0028] This embodiment is a method corresponding to the device for measuring the optical rotation of a transparent thin film with a periodic chiral structure proposed in Embodiment 1, which includes the following steps:
[0029] ① Turn on the light source 1 for measurement, then adjust the polarization direction of the polarizer 2 and the polarization direction of the analyzer 7 to be orthogonal, then fix the transparent thin film with a periodic chiral structure to be measured on the sample stage, and make the to-be The measured transparent film with periodic chiral structure is perpendicular to the light propagation path of the light beam emitted by the light source 1 for measurement.
[0030] Then, adjust the position of the sample stage so that the beam passing through the aperture 3 is vertically irradiated on the periodic chiral structure transparent film to be measured; and adjust the aperture 3 so that the beam passing through the aperture is vertically irradiated on th...
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