Handheld digital integrated circuit parameter tester

Abstract

A hand-held digital integrated circuit parameter tester, relating to an integrated circuit parameter tester, comprising a power management module, a central control module, a chip test interface, a communication module, and a man-machine interface module, the output terminal of the power management module is connected to the central control module The central control module includes single-chip microcomputer Ⅰ and single-chip microcomputer Ⅱ. The single-chip microcomputer Ⅰ is connected to the chip test interface. The single-chip microcomputer Ⅱ is directly connected to the communication module and the man-machine interface module through I / O pins. The communication module is directly connected through the SPI bus; the communication module includes a serial communication interface chip and its peripheral circuit, and the output terminal of the communication module is connected with the input terminal of the upper computer. The invention has the advantages of perfect function, stable work, simple operation, small size, low cost, etc., can be used as a teaching instrument or a testing instrument, and is suitable for popularization in school laboratories or amateur electronic enthusiasts.

Description

technical field [0001] The invention relates to an integrated circuit parameter tester, in particular to a handheld digital integrated circuit parameter tester. Background technique [0002] In the development and design of electronic systems or related practical teaching, many digital integrated circuit chips will be used. Chips will be reused in many occasions, and it is inevitable that chips will fail at this time. Using a damaged digital integrated circuit chip will greatly increase the difficulty of debugging the circuit system, and before using the chip, it is impossible to check whether the function of the chip is intact through common instruments. The professional-grade integrated circuit testing instruments used in engineering have perfect functions, but at the same time, they have disadvantages such as high price, complicated operation, and bulky size. [0003] The invention patent with the announcement number CN202583410 provides a portable Chinese interface dig...

AI Technical Summary

Problems solved by technology

[0005] The technical problem to be solved by the present invention is to provide a hand-held digital integrated circuit parameter tester to solve the problem of single test parameters, imperfect functions, complex man-machine interface operation and easy failure, and high test cost when testing digital integrated circuit chips. Shortcomings

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