Method based on atomic force microscope for researching microscopic characteristics of asphalt
A technology of atomic force microscope and asphalt, which is applied in the direction of scanning probe microscopy, measuring devices, instruments, etc., can solve the problems of one-sidedness and phenomenology, and achieve the effect of simple equipment, easy operation and sample preparation
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[0021] (1) Sample preparation
[0022] 1) Heat the asphalt to a liquid state, in which the base asphalt is heated to 120°C; the modified asphalt is heated to 160°C; 2) Take the heated asphalt and drop it on a 40mm×15mm×1mm glass slide; 3) Put the slide into Heat it in an oven for 10 minutes to spread the asphalt evenly, with a diameter of about 1 cm, and take it out to cool naturally as an asphalt sample.
[0023] (2) Surface topography imaging
[0024] The atomic force microscope uses a probe located at one end of the cantilever that is very sensitive to external forces to detect the interaction force between the tip and the sample to image the surface of the sample.
[0025] The imaging mode is tapping mode. The silicon nitride cantilever probe is used to scan and image the sample. The standard elastic number of the cantilever beam is 42N / m, the probe height is 11um, the cantilever length is 125um, the resonance frequency is 260kHz, and the scanning range is 40um. ×40um, i...
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