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System self-test method, equipment and system

A device and self-inspection technology, applied in the field of communication applications, can solve the problems of long response time and low reliability when starting up

Inactive Publication Date: 2013-12-18
HANGZHOU HUAWEI DIGITAL TECH
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] Embodiments of the present invention provide a method, device, and system for system self-test, which solve the problems of long power-on response time and low reliability in the process of system self-test when the memory self-test function is turned on and off during power-on self-test

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  • System self-test method, equipment and system
  • System self-test method, equipment and system

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Embodiment Construction

[0095] In order to more clearly illustrate the technical solutions in the embodiments of the present invention or the prior art, the following will briefly introduce the drawings that need to be used in the description of the embodiments or the prior art. Obviously, the accompanying drawings in the following description are only These are some embodiments of the present invention. Those skilled in the art can also obtain other drawings based on these drawings without creative work.

[0096] An embodiment of the present invention provides a system self-checking method, referring to figure 1 As shown in , the device side of the system self-test includes:

[0097] 101. The system self-test device sends a memory test request to the management device.

[0098] Here, during the system power-on self-test, the management software is invoked by sending a memory test request, so that the management software obtains the corresponding memory test information according to the memory test ...

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Abstract

The embodiment of the invention discloses a system self-test method, equipment and system, which relate to communication application technology and are used for solving the problems of long startup response time when a memory self-test function is started and shut off in power-on self-test and low reliability in a system self-test process. The method comprises the following steps: transmitting a memory test request to management equipment through system self-test equipment; receiving memory testing information generated by the management equipment according to the memory test request; acquiring a memory test parameter by resolving the memory test information, wherein the memory test parameter comprises a memory test target and / or memory test strategy information; and triggering memory detection of a corresponding memory position according to the memory test parameter. The embodiment of the invention is applied to power-on self-test of a server.

Description

technical field [0001] The invention relates to communication application technology, in particular to a method, device and system for system self-inspection. Background technique [0002] After an existing server is powered on, the server's system goes through a self-checking routine. This process is usually called POST Power On Self Test (Power On Self Test). Among them, the POST power-on self-test will detect all the hardware in the system. Here, the POST power-on self-test process is mainly completed by the basic input and output system BIOS (Basic Input Output System), where POST mainly completes the following tasks: a. Verify the CPU (Central Processing Unit) register; b. Verify the BIOS itself Integrity, initialize BIOS; c, verify your functions, such as direct memory access DMA (Direct Memory Access), timer, interrupt controller; d, discover, identify memory size, verify memory; e, provide a structure for The system is configured. The above are mainly the basic f...

Claims

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Application Information

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IPC IPC(8): G06F11/22
Inventor 应勤
Owner HANGZHOU HUAWEI DIGITAL TECH
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