Method and apparatus for simultaneous RF testing of multiple devices in specific frequency bands

Abstract

A system employing vector signal generator (VSG) and vector signal analyzer (VSA) modules or cards that are configured to test multiple devices under test simultaneously. Each VSG is configured to generate multiple RF test signals and send them to multiple devices under test simultaneously. Similarly, each VSA is configured with multiple signal receiving modules connected to a single controller or memory. Each signal receiving module receives an RF signal from a device under test, converts it to a baseband digital signal, and transmits this digital signal to the VSA's memory. A single RF testing system can employ multiple such VSGs and VSAs, each capable of evaluating multiple devices under test. Each VSG / VSA can further be tuned for operation in discrete or defined frequency bands, which are narrower than those for conventional RF testers, and which can correspond to various wireless standards.

Description

technical field [0001] Embodiments of the invention generally relate to radio frequency (RF) testing. More specifically, the embodiments of the present invention relate to a method and an apparatus for simultaneously performing a radio frequency test on multiple devices in a specific frequency band. Background technique [0002] Recently, the proliferation of wireless devices and other systems with RF transmit / receive capabilities (such as cellular phones and RF modules, and other RF-capable devices (such as ICs), base stations, RF transmitters, other wireless systems) has led to increased The need for RF test equipment. Such test equipment, which is typically used to test the RF functionality of a wireless device, typically operates by sending RF test signals, including data or commands, to a target wireless device or device under test. The device under test is programmed to generate specific RF signals in response, and these response signals are sent back to the test equ...

AI Technical Summary

Problems solved by technology

[0003] However, current modular RF test equipment suffers from several disadvantages

For example, most single-module or RF test cards are often limited in their ability to simultaneously scan multiple devices under test

Also, given that current modular RF test equipment is designed to cover a wide frequency range, they suffer from complex and costly design

Consequently, the RF test process often suffers from both low throughput and slowing down the manufacturing and inspection process, but also suffers from high cost

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