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Simultaneous multi-beam accurate scanning and sampling method in phased-array antenna near-field measurement

A phased array antenna, precise scanning technology, applied in the direction of the antenna radiation pattern, etc., can solve the problem of spending a certain amount of time, deviating from the ideal sampling point, etc., to reduce repetitive work and facilitate batch processing.

Inactive Publication Date: 2013-10-09
THE 724TH RES INST OF CHINA SHIPBUILDING IND
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Problems solved by technology

This method seems simple. However, the beam switching of the phased array antenna and the sampling measurement of the RF system both take a certain amount of time, resulting in the actual sampling measurement position of each beam deviates from the ideal sampling point to varying degrees. How to allow the deviation to occur And to ensure the accuracy of the beam shape obtained by calculating the sampling data is a problem that needs to be solved in the phased array antenna near-field multi-beam measurement technology

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  • Simultaneous multi-beam accurate scanning and sampling method in phased-array antenna near-field measurement
  • Simultaneous multi-beam accurate scanning and sampling method in phased-array antenna near-field measurement
  • Simultaneous multi-beam accurate scanning and sampling method in phased-array antenna near-field measurement

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Embodiment Construction

[0019] The concrete implementation method of the present invention is:

[0020] 1. Using the MCU hardware platform to design the encoding controller, the controller can receive the beam encoding sequence, delay length, beam switching instruction code, sampling measurement instruction code sent by the computer, and store them in the RAM of the MCU. When the electrical pulse signal of the positioner is received, it is directly transferred to the interrupt source of the MCU, and the interrupt program is started. In the interrupt program, the controller reads the first code of the beam coding sequence from RAM, sends it to the beam control system of the phased array antenna, and then sends the beam switching command; The measurement system sends a sampling measurement command, and after a delay of a fixed time T1, continues to read and send the next beam code, and so on until all beam code sequences are sent and the sampling measurement is completed. Finally, return a complete co...

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Abstract

The invention belongs to a simultaneous multi-beam accurate scanning and sampling method in phased-array antenna near-field measurement. According to the method, a probe locator slides at a uniform velocity in the preset direction, sends an electric pulse to a code controller when passing through the sampling position, the code controller coordinates with a beam control system and a radio frequency measurement system of a phased-array antenna according to a preset precise work cycle, a preset command timing sequence and a preset number of times of work for finishing beam switching of a plurality of times and radio frequency sampling measurement, radio frequency measurement of simultaneous multi-beam accurate scanning and sampling at one sampling position is carried out, the sampling datum of each beam obtains fixed position offset at all sampling positions, so that the near-field measurement sampling intervals of all beams keep identical, and mathematical calculation from a near field to a far field is facilitated.

Description

technical field [0001] The invention relates to the measurement technology of antenna near-field phased array beam control. Through the precise control of instructions, delays and work times, simultaneous multi-beam scanning and sampling measurement is realized at one sampling position, and the sampling intervals of each beam are kept consistent. , which is convenient for near-field to far-field mathematical calculations (fast Fourier transform). Background technique [0002] The invention is used for simultaneous multi-beam precise scanning and sampling in the near-field measurement of the phased array antenna. [0003] 3~5 away from the antenna under test lambda ( lambda is the working wavelength) distance, use a probe with known electrical characteristics to scan and sample the amplitude and phase data of the electromagnetic field on a certain plane or curved surface in the vicinity of the antenna under test according to the sampling theorem, and then undergo strict mat...

Claims

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Application Information

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IPC IPC(8): G01R29/10
Inventor 朱平
Owner THE 724TH RES INST OF CHINA SHIPBUILDING IND
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