Novel, intelligent and multifunctional comprehensive tester and testing method

Abstract

The invention provides a comprehensive tester for testing intelligent substation digital secondary equipment. The comprehensive tester is composed of an upper machine and a lower machine. The upper machine serves as a software platform, is built by using an object-oriented programming language and is arranged in an externally-connected PC, and the lower machine serves as a hardware platform and is of an FPGA plus ARM main structure. The comprehensive tester can work in any of four working modes according to needs, can serve as a data source and output messages in the IEC61860-9-2 format or messages in the GOOSE format or messages in the IEC60044-8 format, can also serve as a data format conversion device and convert signals with small voltage analog quantity (<+ / -10V) or the messages in the IEC60044-8 format into the messages in the IEC61850-9-2 format, achieve conversion between the messages in the GOOSE format and switching value signals and carry out test work on the intelligent substation digital secondary equipment.

Description

technical field [0001] The invention relates to the technical field of intelligent substations, in particular to a novel intelligent multifunctional comprehensive test instrument and a test method. Background technique [0002] With the advancement of smart grid construction, the construction of smart substations has entered the stage of promotion and implementation. Compared with the traditional substation secondary equipment of the power grid, the digital secondary equipment has undergone major changes in information transmission, resulting in significant changes in some principles and structures of the equipment. Changes in the implementation and application of equipment, on the one hand, make the original testing and assessment methods, items and standards no longer applicable to digital secondary equipment, and put forward new requirements for the inspection and testing of this type of equipment. On the other hand, due to the advancement of intelligent technology, a si...

AI Technical Summary

Problems solved by technology

However, due to the relatively single function of these devices, they can only complete certain specific functions, for example: the digital relay protection tester can only be used as a data source to detect digital secondary devices, and cannot effectively analyze the detection data; and The output data channel is limited, and the amount of output data information is limited, which leads to more types and quantities of equipment required for the test. On the one hand, this makes the structure and wiring of the test system more complicated, and reduces the efficiency of the test work. On the other hand, it makes the test The cost of the system is relatively high

In addition, some objects to be tested, such as merging units, intelligent terminals and other equipment, are part of the test system in other test projects; therefore, in different test projects, in order to meet the different needs of equipment use purposes, these The wiring and settings of the equipment must be changed accordingly, which increases the workload of the test work

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